ASTM E 2695 : 2009
Withdrawn
A Withdrawn Standard is one, which is removed from sale, and its unique number can no longer be used. The Standard can be withdrawn and not replaced, or it can be withdrawn and replaced by a Standard with a different number.
Standard Guide for Interpretation of Mass Spectral Data Acquired with Time-of-Flight Secondary Ion Mass Spectroscopy (Withdrawn 2018)
Hardcopy , PDF
17-01-2018
English
01-05-2009
Important note : Users cannot be edited or removed once added to your Multi user PDF.CONTAINED IN VOL. 03.06, 2015 Defines time-of-flight secondary ion mass spectrometry (ToF-SIMS) users with a method for forms of interpretation of mass spectral data.
| Committee |
E 42
|
| DocumentType |
Guide
|
| Pages |
12
|
| PublisherName |
American Society for Testing and Materials
|
| Status |
Withdrawn
|
1.1 This guide provides time-of-flight secondary ion mass spectrometry (ToF-SIMS) users with a method for forms of interpretation of mass spectral data. This guide is applicable to most ToF-SIMS instruments and may or may not be applicable to other forms of secondary icon mass spectrometry (SIMS).
1.2 This guide does not purport to address methods of sample preparation. It is the responsibility of the user to adhere to strict sample preparation procedures in order to minimize contamination and optimize signals. See Guide E1078 and ISO 18116 for sample preparation guidelines.
1.3 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.
1.4 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.
| ISO 23830:2008 | Surface chemical analysis — Secondary-ion mass spectrometry — Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry |
| ASTM E 1078 : 2014 : REDLINE | Standard Guide for Specimen Preparation and Mounting in Surface Analysis |
| ASTM E 1504 : 2011 : REDLINE | Standard Practice for Reporting Mass Spectral Data in Secondary Ion Mass Spectrometry (SIMS) |
| ASTM E 673 : 2003 | Standard Terminology Relating to Surface Analysis (Withdrawn 2012) |
| ISO 18115:2001 | Surface chemical analysis Vocabulary |
| ISO 18116:2005 | Surface chemical analysis — Guidelines for preparation and mounting of specimens for analysis |
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