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Standard Practice for Radiologic Examination of Semiconductors and Electronic Components
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Available format(s): Hardcopy, PDF
Superseded date: 03-07-2021
Language(s): English
Published date: 08-07-2014
Publisher: American Society for Testing and Materials
CONTAINED IN VOL. 03.03, 2017 Describes the minimum requirements for nondestructive radiologic examination of semiconductor devices, microelectronic devices, electromagnetic devices, electronic and electrical devices, and the materials used for construction of these items.
1.1This practice provides the minimum requirements for nondestructive radiologic examination of semiconductor devices, microelectronic devices, electromagnetic devices, electronic and electrical devices, and the materials used for construction of these items.
1.2This practice covers the radiologic examination of these items to detect possible defective conditions within the sealed case, especially those resulting from sealing the lid to the case, and internal defects such as extraneous material (foreign objects), improper interconnecting wires, voids in the die attach material or in the glass (when sealing glass is used) or physical damage.
1.3The values stated in inch-pound units are to be regarded as standard. No other units of measurement are included in this practice.
1.4This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.
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