ASTM E 801 : 2021
Current
The latest, up-to-date edition.
Standard Practice for Controlling Quality of Radiographic Examination of Electronic Devices
Hardcopy , PDF
English
07-12-2021
Committee |
E 07
|
DocumentType |
Standard Practice
|
Pages |
5
|
PublisherName |
American Society for Testing and Materials
|
Status |
Current
|
Supersedes |
1.1This practice relates to the radiographic examination of electronic devices for internal discontinuities, extraneous material, missing components, crimped or broken wires, and defective solder joints in cavities, in the encapsulating materials, or the boards. Requirements expressed in this practice are intended to control the quality and repeatability of the radiographic images and are not intended for controlling the acceptability or quality of the electronic devices imaged.
1.2There are areas in this practice that may require agreement between the cognizant engineering organization and the supplier, or specific direction from the cognizant engineering organization. These items should be addressed in the purchase order, contract, or inspection technique. Specific applications may require adherence to this practice in part or in full. Deviations from this practice shall be enumerated in inspection plan and approved by both cognizant engineering organization and the supplier.
1.3This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use.
1.4This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.
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ASTM E 543 : 2021 | Standard Specification for Agencies Performing Nondestructive Testing |
ASTM E 1161 : 2021 | Standard Practice for Radiographic Examination of Semiconductors and Electronic Components |
ASTM E 94/E94M : 2017 | Standard Guide for Radiographic Examination Using Industrial Radiographic Film |
ASTM E 431 : 1996 : R2016 | Standard Guide to Interpretation of Radiographs of Semiconductors and Related Devices |
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ASTM E 1316 : 2021 : REV D | Standard Terminology for Nondestructive Examinations |
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ASTM E 1316 : 2023 : REV A | Standard Terminology for Nondestructive Examinations |
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ASTM E 1316 : 2021 : REV C | Standard Terminology for Nondestructive Examinations |
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