ASTM F 144 : 1980 : R1995 : EDT 1
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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Standard Practice for Making Reference Glass-Metal Sandwich Seal and Testing for Expansion Characteristics by Polarimetric Methods
Hardcopy , PDF
11-11-2014
English
01-01-2000
Important note : Users cannot be edited or removed once added to your Multi user PDF.CONTAINED IN VOL. 15.02, 2017 Describes the preparation and testing of a reference glass-metal sandwich seal for determining stress in the glass or for determining the degree of thermal expansion (or contraction) mismatch between the glass and metal.
| Committee |
C 14
|
| DocumentType |
Standard Practice
|
| Pages |
5
|
| ProductNote |
Reconfirmed EDT 1
|
| PublisherName |
American Society for Testing and Materials
|
| Status |
Superseded
|
| SupersededBy |
1.1 This practice covers the preparation and testing of a reference glass-metal sandwich seal for determining stress in the glass or for determining the degree of thermal expansion (or contraction) mismatch between the glass and metal. Tests are in accordance with Method F218 (Section 2).
1.2 This practice applies to all glass and metal (or alloy) combinations normally sealed together in the production of electronic components.
1.3 The practical limit of the test in deriving mismatch is approximately 300 ppm, above which the glass is likely to fracture.
1.4 This standard does not purport to address all of the safety problems, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.
| ASTM F 218 : 2013 : REDLINE | Standard Test Method for Measuring Optical Retardation and Analyzing Stress in Glass |
| ASTM F 31 : 2016 : REDLINE | Standard Specification for Nickel-Chromium-Iron Sealing Alloys |
| ASTM F 30 : 1996 | Standard Specification for Iron-Nickel Sealing Alloys |
| ASTM F 47 : 1994 | Test Method for Crystalographic Perfection of Silicon by Preferential Etch Techniques (Withdrawn 1998) |
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