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  • ASTM F 47 : 1994

    Superseded A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

    Test Method for Crystalographic Perfection of Silicon by Preferential Etch Techniques (Withdrawn 1998)

    Available format(s): 

    Superseded date:  31-12-1998

    Language(s): 

    Published date:  31-12-2010

    Publisher:  American Society for Testing and Materials

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    Abstract - (Show below) - (Hide below)

    CONTAINED IN VOL. 10.05 1997 Determines whether piece of silicon is monocrystalline in structure and if so, density of dislocations present. Swirls and striations may be delineated. Defects described to avoid confusion when counting dislocation etch pits.

    General Product Information - (Show below) - (Hide below)

    Document Type Test Method
    Publisher American Society for Testing and Materials
    Status Superseded

    Standards Referenced By This Book - (Show below) - (Hide below)

    ASTM F 1723 : 1996 Standard Practice for Evaluation of Polycrystalline Silicon Rods by Float-Zone Crystal Growth and Spectroscopy
    ASTM F 76 : 2008 : R2016 Standard Test Methods for Measuring Resistivity and Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors
    ASTM F 40 : 1983 Method for Preparing Monocrystalline Test Ingots of Silicon by the Vertical-Pulling (Czochralski) Technique (Withdrawn 1988)
    MIL-STD-989 Base Document:1991 CERTIFICATION REQUIREMENTS FOR JAN SEMICONDUCTOR DEVICES
    ASTM F 144 : 1980 : R2000 Standard Practice for Making Reference Glass-Metal Sandwich Seal and Testing for Expansion Characteristics by Polarimetric Methods
    ASTM F 140 : 1998 : R2008 Standard Practice for Making Reference Glass-Metal Butt Seals and Testing for Expansion Characteristics by Polarimetric Methods
    ASTM F 144 : 1980 : R1995 : EDT 1 Standard Practice for Making Reference Glass-Metal Sandwich Seal and Testing for Expansion Characteristics by Polarimetric Methods
    ASTM F 144 : 1980 : R2010 Standard Practice for Making Reference Glass-Metal Sandwich Seal and Testing for Expansion Characteristics by Polarimetric Methods
    ASTM F 140 : 1998 : R2013 Standard Practice for Making Reference Glass-Metal Butt Seals and Testing for Expansion Characteristics by Polarimetric Methods
    ASTM F 144 : 1980 : R2015 Standard Practice for Making Reference Glass-Metal Sandwich Seal and Testing for Expansion Characteristics by Polarimetric Methods
    ASTM F 140 : 1998 Standard Practice for Making Reference Glass-Metal Butt Seals and Testing for Expansion Characteristics by Polarimetric Methods
    ASTM F 144 : 1980 : R2005 Standard Practice for Making Reference Glass-Metal Sandwich Seal and Testing for Expansion Characteristics by Polarimetric Methods
    ASTM F 140 : 1998 : R2003 Standard Practice for Making Reference Glass-Metal Butt Seals and Testing for Expansion Characteristics by Polarimetric Methods
    ASTM F 850 : 1983 : R1988 Test Method for Crystallographic Perfection of Gadolinium Gallium Garnet by Preferential Etch Techniques (Withdrawn 1992)
    UNE-EN 50513:2011 Solar wafers - Data sheet and product information for crystalline silicon wafers for solar cell manufacturing
    ASTM F 1404 : 1992 : R1999 Test Method for Crystallographic Perfection of Gallium Arsenide by Molten Potassium Hydroxide (KOH) Etch Technique
    ASTM F 1404 : 1992 : R2007 Test Method for Crystallographic Perfection of Gallium Arsenide by Molten Potassium Hydroxide (KOH) Etch Technique (Withdrawn 2016)
    ASTM F 140 : 1998 : R2020 Standard Practice for Making Reference Glass-Metal Butt Seals and Testing for Expansion Characteristics by Polarimetric Methods
    ASTM F 144 : 1980 : R2019 Standard Practice for Making Reference Glass-Metal Sandwich Seal and Testing for Expansion Characteristics by Polarimetric Methods
    ASTM F 416 : 1994 Test Method for Detection of Oxidation Induced Defects in Polished Silicon Wafers (Withdrawn 1998)
    ASTM F 76 : 2008 Standard Test Methods for Measuring Resistivity and Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors
    ASTM F 76 : 2008 : R2016 : EDT 1 Standard Test Methods for Measuring Resistivity and Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors (Withdrawn 2023)

    Standards Referencing This Book - (Show below) - (Hide below)

    ASTM E 7 : 2017 : REDLINE Standard Terminology Relating to Metallography
    ASTM F 416 : 1994 Test Method for Detection of Oxidation Induced Defects in Polished Silicon Wafers (Withdrawn 1998)
    ANSI B74.10 : 2015 GRADING OF ABRASIVE MICROGRITS
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