ASTM F 1467 : 2011-10
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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GUIDE FOR USE OF AN X-RAY TESTER ([APPROXIMATE] 10 KEV PHOTONS) IN IONIZING RADIATION EFFECTS TESTING OF SEMICONDUCTOR DEVICES AND MICROCIRCUITS
31-08-2020
01-10-2011
CONTAINED IN VOL. 10.04, 2018 Defines recommended procedures for the use of X-ray testers (that is, sources with a photon spectrum having approximately equal to 10 ke V mean photon energy and approximately equal to 50 ke V maximum energy) in testing semiconductor discrete devices and integrated circuits for effects from ionizing radiation.
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