MIL-STD-1546 Revision B:1992
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PARTS, MATERIALS, AND PROCESSES CONTROL PROGRAM FOR SPACE AND LAUNCH VEHICLES
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ASTM F 1191 : 1988
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Guide for the Radiation Testing of Semiconductor Memories (Withdrawn 1993)
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ASTM F 632 : 1990
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Test Method for Measuring Small-Signal Comon Emitter Current Gain of Transistors at High Frequencies (Withdrawn 1995)
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MIL-HDBK-814 Base Document:1994
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IONIZING DOSE AND NEUTRON HARDNESS ASSURANCE GUIDELINES FOR MICROCIRCUITS AND SEMICONDUCTOR DEVICES
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ASTM E 845 : 1981
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Method for Calibration of Dosimeters Against an Adiabatic Calorimeter for Use in Flash X-Ray Fields (Withdrawn 1987)
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ASTM E 665 : 1994
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Practice for Using Absorbed Dose Versus Depth in Materials to Verify the X-ray Output of Flash X-ray Machines (Withdrawn 2000)
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MIL-STD-883 Revision K:2016
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TEST METHOD STANDARD - MICROCIRCUITS
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ASTM E 720 : 2016 : REDLINE
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Standard Guide for Selection and Use of Neutron Sensors for Determining Neutron Spectra Employed in Radiation-Hardness Testing of Electronics
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ASTM E 763 : 1991
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Practice for Calculation of Absorbed Dose From Neutron Irradiation by Application of Threshold-Foil Measurement Data (Withdrawn 1997)
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ASTM F 980 : 2016 : REDLINE
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Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices
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MIL-STD-480 Revision B:1988
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CONFIGURATION CONTROL - ENGINEERING CHANGES, DEVIATIONS AND WAIVERS
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ASTM F 617 : 2000
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Standard Test Method for Measuring MOSFET Linear Threshold Voltage (Withdrawn 2006)
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ASTM E 1205 : 2009
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PRACTICE FOR USE OF A CERIC-CEROUS SULFATE DOSIMETRY SYSTEM
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MIL-STD-1547 Revision B:1992
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ELECTRONIC PARTS, MATERIALS, AND PROCESSES FOR SPACE VEHICLES
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DOD STD 100 : C NOTICE 6
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ENGINEERING DRAWING PRACTICES
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MIL-STD-1809 Base Document:1991
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SPACE ENVIRONMENT FOR USAF SPACE VEHICLES
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ASTM F 526 : 2016 : REDLINE
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Standard Test Method for Using Calorimeters for Total Dose Measurements in Pulsed Linear Accelerator or Flash X-ray Machines
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ASTM E 265 : 2015 : REDLINE
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Standard Test Method for Measuring Reaction Rates and Fast-Neutron Fluences by Radioactivation of Sulfur-32
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ASTM F 618 : 1979
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Method for Measuring MOSFET Saturated Threshold Voltage
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MIL-HDBK-279 Base Document:1985
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TOTAL DOSE HARDNESS ASSURANCE GUIDELINE FOR SEMICONDUCTOR DEVICE & MICROCIRCUIT
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DI-NUOR-80156 Revision B:2013
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Nuclear Survivability Program Plan
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ASTM F 675 : 1991
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Test Method for Measuring Nonequilibrium Transient Photocurrents in P-N Junctions (Withdrawn 1995)
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DOD STD 1766 : A
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NUCLEAR HARDNESS AND SURVIVABILITY PROGRAM REQUIREMENTS FOR ICBM WEAPON SYSTEMS
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MIL-STD-750 Revision F:2011
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TEST METHODS FOR SEMICONDUCTOR DEVICES
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ASTM E 1026 : 2015 : REDLINE
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Standard Practice for Using the Fricke Dosimetry System
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ASTM F 774 : 1982
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Guide for Analysis of Latchup Susceptibility in Bipolar Integrated Circuits (Withdrawn 1987)
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ASTM E 1027 : 1992
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Practice for Exposure of Polymeric Materials to Ionizing Radiation (Withdrawn 1996)
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ASTM E 721 : 2016 : REDLINE
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Standard Guide for Determining Neutron Energy Spectra from Neutron Sensors for Radiation-Hardness Testing of Electronics
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MIL-STD-414 Base Document:1957
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SAMPLING PROCEDURE AND TABLE FOR INSPECTION BY VARIABLES FOR PERCENT DEFECTIVE
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ASTM E 722 : 2014 : REDLINE
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Standard Practice for Characterizing Neutron Fluence Spectra in Terms of an Equivalent Monoenergetic Neutron Fluence for Radiation-Hardness Testing of Electronics
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ASTM E 668 : 2013 : REDLINE
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Standard Practice for Application of Thermoluminescence-Dosimetry (TLD) Systems for Determining Absorbed Dose in Radiation-Hardness Testing of Electronic Devices
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DI-NUOR-80926 Revision A:2013
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Nuclear Survivability Assurance Plan
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MIL-HDBK-816 Base Document:1994
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Guidelines for Developing Radiation Hardness Assurance Device Specifications
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ASTM F 570 : 1990
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Test Method for Transistor Collector-Emitter Saturation Voltage (Withdrawn 1995)
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ASTM E 1249 : 2015 : REDLINE
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Standard Practice for Minimizing Dosimetry Errors in Radiation Hardness Testing of Silicon Electronic Devices Using Co-60 Sources
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MIL-STD-339 Base Document:1987
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WIRING AND WIRING DEVICES FOR COMBAT AND TACTICAL VEHICLES, SELECTION AND INSTALLATION OF
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ASTM F 1032 : 1991
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Guide for Measuring Time-Dependant Total-Dose Effects in Semiconductor Devices Exposed to Pulsed Ionizing Radiation (Withdrawn 1994)
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DI-NUOR-80928 Revision A:2013
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Nuclear Survivability Test Plan
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ASTM E 1250 : 2015 : REDLINE
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Standard Test Method for Application of Ionization Chambers to Assess the Low Energy Gamma Component of Cobalt-60 Irradiators Used in Radiation-Hardness Testing of Silicon Electronic Devices
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MIL-HDBK-780 Revision D:2004
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STANDARD MICROCIRCUIT DRAWINGS
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ASTM F 1096 : 1987
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Method for Measuring Mosfet Saturated Threshold Voltage (Withdrawn 1992)
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DI-ENVR-80266 Revision A:2016
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NUCLEAR HARDNESS AND SURVIVABILITY (NH&S) DESIGN ANALYSIS REPORT
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MIL-HDBK-815 Base Document:1994
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DOSE-RATE HARDNESS ASSURANCE GUIDELINES
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ASTM F 1467 : 2011-10
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GUIDE FOR USE OF AN X-RAY TESTER ([APPROXIMATE] 10 KEV PHOTONS) IN IONIZING RADIATION EFFECTS TESTING OF SEMICONDUCTOR DEVICES AND MICROCIRCUITS
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DI-NUOR-80927 Revision A:2013
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Nuclear Survivability Design Parameters Report
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MIL-HDBK-339 Base Document:1984
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CUSTOM LARGE SCALE INTEGRATED CIRCUIT DEVELOPMENT & ACQUISITION FOR SPACE VEHICLES
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ASTM F 616 : 1992
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Standard Test Method for Measuring MOSFET Drain Leakage Current
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MIL-HDBK-280 Base Document:1985
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NEUTRON HARDNESS ASSURANCE GUIDELINES FOR SEMICONDUCTOR DEVICES AND MICROCIRCUITS
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DI-NUOR-81025 Base Document:1990
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NUCLEAR SURVIVABILITY MAINTENANCE/SURVEILLANCE PLAN
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ASTM E 666 : 2014 : REDLINE
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Standard Practice for Calculating Absorbed Dose From Gamma or X Radiation
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ASTM F 448 : 2011-07
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TEST METHOD FOR MEASURING STEADY-STATE PRIMARY PHOTOCURRENT
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MIL-STD-105 Revision E:1989
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SAMPLING PROCEDURES AND TABLES FOR INSPECTION BY ATTRIBUTES
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ASTM F 769 : 2000
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Standard Test Method for Measuring Transistor and Diode Leakage Currents (Withdrawn 2006)
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ASTM E 820 : 1981
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Practice for Determining Absolute Absorbed Dose Rates for Electron Beams (Withdrawn 1987)
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ASTM F 773 : 1992
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Practice for Measuring Dose Rate Response of Linear Integrated Circuits
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