ASTM F 154 : 2000
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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Standard Guide for Identification of Structures and Contaminants Seen on Specular Silicon Surfaces
Hardcopy , PDF
11-11-2014
English
10-01-2001
Important note : Users cannot be edited or removed once added to your Multi user PDF.| Committee |
F 01
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| DocumentType |
Guide
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| Pages |
13
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| PublisherName |
American Society for Testing and Materials
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| Status |
Superseded
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| SupersededBy |
1.1 The purpose of this guide is to list, illustrate, and provide reference for various characteristic features and contaminants that are seen on highly specular silicon wafers. Recommended practices for delineation and observation of these artifacts are referenced. The artifacts described in this guide are intended to parallel and support the content of the SEMI M18. These artifacts and common synonyms are arranged alphabetically in Tables 1 and 2 and illustrated in Figs. 1-68 .
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