• ASTM F 1709 : 1997 : R2016

    Current The latest, up-to-date edition.

    Standard Specification for High Purity Titanium Sputtering Targets for Electronic Thin Film Applications (Withdrawn 2023)

    Available format(s):  Hardcopy, PDF

    Language(s):  English

    Published date:  16-05-2016

    Publisher:  American Society for Testing and Materials

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    Abstract - (Show below) - (Hide below)

    CONTAINED IN VOL. 10.04, 2016 Defines pure titanium sputtering targets used as a raw material in fabricating semiconductor electronic devices.

    Scope - (Show below) - (Hide below)

    1.1This specification covers pure titanium sputtering targets used as a raw material in fabricating semiconductor electronic devices.

    1.2This standard sets purity grade levels, physical attributes, analytical methods, and packaging.

    1.2.1The grade designation is a measure of total metallic impurity content. The grade designation does not necessarily indicate suitability for a particular application because factors other than total metallic impurity may influence performance.

    General Product Information - (Show below) - (Hide below)

    Committee F 01
    Document Type Standard
    Product Note Reconfirmed 2016
    Publisher American Society for Testing and Materials
    Status Current
    Supersedes

    Standards Referenced By This Book - (Show below) - (Hide below)

    ASTM F 3166 : 2016 Standard Specification for High-Purity Titanium Sputtering Target Used for Through-Silicon Vias (TSV) Metallization (Withdrawn 2023)

    Standards Referencing This Book - (Show below) - (Hide below)

    ASTM E 112 : 2013 : R2021 Standard Test Methods for Determining Average Grain Size
    ASTM E 112 : 2013 Standard Test Methods for Determining Average Grain Size
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