ASTM F 612 : 1988
Withdrawn
A Withdrawn Standard is one, which is removed from sale, and its unique number can no longer be used. The Standard can be withdrawn and not replaced, or it can be withdrawn and replaced by a Standard with a different number.
Practice for Cleaning Surfaces of Polished Silicon Slices (Withdrawn 1993)
01-05-1996
31-12-2010
CONTAINED IN VOL 10.05 1996 Describes technique for cleaning silicon slices. Produces slice surfaces that are free of visible particulate matter when viewed under bright illumination by unaided eye.
| Committee |
ASTM
|
| DocumentType |
Standard Practice
|
| PublisherName |
American Society for Testing and Materials
|
| Status |
Withdrawn
|
| ASTM F 416 : 1994 | Test Method for Detection of Oxidation Induced Defects in Polished Silicon Wafers (Withdrawn 1998) |
| FED-STD-209 Revision E:1992 | AIRBORNE PARTICULATE CLEANLINESS CLASSES IN CLEANROOMS AND CLEAN ZONES |
| ASTM D 1125 : 2014 : REDLINE | Standard Test Methods for Electrical Conductivity and Resistivity of Water (Withdrawn 2023) |
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