ASTM F 980 : 2016
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
View Superseded by
Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices
Hardcopy , PDF
17-01-2024
English
06-09-2023
Important note : Users cannot be edited or removed once added to your Multi user PDF.| Committee |
E 10
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| DocumentType |
Guide
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| Pages |
7
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| PublisherName |
American Society for Testing and Materials
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| Status |
Superseded
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| SupersededBy | |
| Supersedes |
1.1This guide defines the requirements and procedures for testing silicon discrete semiconductor devices and integrated circuits for rapid-annealing effects from displacement damage resulting from neutron radiation. This test will produce degradation of the electrical properties of the irradiated devices and should be considered a destructive test. Rapid annealing of displacement damage is usually associated with bipolar technologies.
1.1.1Heavy ion beams can also be used to characterize displacement damage annealing (1)2, but ion beams have significant complications in the interpretation of the resulting device behavior due to the associated ionizing dose. The use of pulsed ion beams as a source of displacement damage is not within the scope of this standard.
1.2The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.
1.3This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to consult and establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.
| ASTM F 1190 : 2018 | Standard Guide for Neutron Irradiation of Unbiased Electronic Components |
| ASTM E 1855 : 2005 | Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors |
| ASTM E 1854 : 1996 | Standard Practice for Ensuring Test Consistency in Neutron-Induced Displacement Damage of Electronic Parts |
| ASTM E 1855 : 2004 | Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors |
| ASTM E 1855 : 2004 : EDT 1 | Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors |
| ASTM E 1854 : 2005 | Standard Practice for Ensuring Test Consistency in Neutron-Induced Displacement Damage of Electronic Parts |
| ASTM E 1855 : 2005 : EDT 1 | Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors |
| ASTM E 264 : 2019 | Standard Test Method for Measuring Fast-Neutron Reaction Rates by Radioactivation of Nickel |
| ASTM E 1855 : 2015 | Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors |
| ASTM E 720 : 2002 | Standard Guide for Selection and Use of Neutron Sensors for Determining Neutron Spectra Employed in Radiation-Hardness Testing of Electronics |
| ASTM E 1854 : 2003 | Standard Practice for Ensuring Test Consistency in Neutron-Induced Displacement Damage of Electronic Parts |
| ASTM E 264 : 1992 : R1996 | Standard Test Method for Measuring Fast-Neutron Reaction Rates by Radioactivation of Nickel |
| ASTM E 721 : 2016 | Standard Guide for Determining Neutron Energy Spectra from Neutron Sensors for Radiation-Hardness Testing of Electronics |
| ASTM E 1894 : 2013 : REV A | Standard Guide for Selecting Dosimetry Systems for Application in Pulsed X-Ray Sources |
| ASTM E 1894 : 2018 | Standard Guide for Selecting Dosimetry Systems for Application in Pulsed X-Ray Sources |
| ASTM E 1855 : 2020 | Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors |
| ASTM E 721 : 2022 | Standard Guide for Determining Neutron Energy Spectra from Neutron Sensors for Radiation-Hardness Testing of Electronics |
| ASTM E 666 : 2021 | Standard Practice for Calculating Absorbed Dose From Gamma or X Radiation |
| ASTM E 1854 : 2013 | Standard Practice for Ensuring Test Consistency in Neutron-Induced Displacement Damage of Electronic Parts |
| ASTM E 1855 : 2010 | Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors |
| ASTM E 1894 : 1997 | Standard Guide for Selecting Dosimetry Systems for Application in Pulsed X-Ray Sources |
| ASTM E 264 : 1992 | Standard Test Method for Measuring Fast-Neutron Reaction Rates by Radioactivation of Nickel |
| ASTM E 1894 : 2008 | Standard Guide for Selecting Dosimetry Systems for Application in Pulsed X-Ray Sources |
| ASTM E 1854 : 2019 | Standard Practice for Ensuring Test Consistency in Neutron-Induced Displacement Damage of Electronic Parts |
| ASTM E 720 : 2016 | Standard Guide for Selection and Use of Neutron Sensors for Determining Neutron Spectra Employed in Radiation-Hardness Testing of Electronics |
| ASTM E 1854 : 2007 | Standard Practice for Ensuring Test Consistency in Neutron-Induced Displacement Damage of Electronic Parts |
| ASTM E 1855 : 1996 | Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors |
| ASTM E 720 : 1994 | Standard Guide for Selection and Use of Neutron-Activation Foils for Determining Neutron Spectra Employed in Radiation-Hardness Testing of Electronics |
| ASTM E 720 : 2023 | Standard Guide for Selection and Use of Neutron Sensors for Determining Neutron Spectra Employed in Radiation-Hardness Testing of Electronics |
| ASTM E 666 : 2014 | Standard Practice for Calculating Absorbed Dose From Gamma or X Radiation |
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