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BIS IS/IEC 61558-2-6 : 1ED 2016

BIS IS/IEC 61558-2-6 : 1ED 2016

Superseded

Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

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superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 44: NEUTRON BEAM IRRADIATED SINGLE EVENT EFFECT (SEE) TEST METHOD FOR SEMICONDUCTOR DEVICES

Superseded date

08-01-2024

Published date

09-08-2016

Publisher

Bureau of Indian Standards

FOREWORD
1 Scope
2 Normative references
3 Terms and definitions
4 Test apparatus
5 Procedure neutron irradiated soft error test
6 Evaluation
7 Summary
Annex A (informative) - Additional information for the
        applicable procurement specification
Annex B (informative) - White neutron test apparatus
Annex C (informative) - Failure rate calculation
Bibliography

Defines a procedure for measuring the single event effects (SEEs) on high density integrated circuit semiconductor devices including data retention capability of semiconductor devices with memory when subjected to atmospheric neutron radiation produced by cosmic rays.

Committee
TC 47
DevelopmentNote
Stability Date: 2020. (07/2016)
DocumentType
Standard
PublisherName
Bureau of Indian Standards
Status
Superseded
SupersededBy
Supersedes

IEC 60749-38:2008 Semiconductor devices - Mechanical and climatic test methods - Part 38: Soft error test method for semiconductor devices with memory
IEC 62396-4:2013 Process management for avionics - Atmospheric radiation effects - Part 4: Design of high voltage aircraft electronics managing potential single event effects
IEC 62396-5:2014 Process management for avionics - Atmospheric radiation effects - Part 5: Assessment of thermal neutron fluxes and single event effects in avionics systems

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