CEI EN 60749-44 : 1ED 2017
Current
The latest, up-to-date edition.
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 44: NEUTRON BEAM IRRADIATED SINGLE EVENT EFFECT (SEE) TEST METHOD FOR SEMICONDUCTOR DEVICES
Hardcopy , PDF
English
01-06-2017
FOREWORD
1 Scope
2 Normative references
3 Terms and definitions
4 Test apparatus
5 Procedure neutron irradiated soft error test
6 Evaluation
7 Summary
Annex A (informative) - Additional information for the applicable
procurement specification
Annex B (informative) - White neutron test apparatus
Annex C (informative) - Failure rate calculation
Bibliography
Sets up a procedure for measuring the single event effects (SEEs) on high density integrated circuit semiconductor devices including data retention capability of semiconductor devices with memory when subjected to atmospheric neutron radiation produced by cosmic rays.
| Committee |
CT 309
|
| DevelopmentNote |
Classificazione CEI 47-139. (07/2017)
|
| DocumentType |
Standard
|
| Pages |
28
|
| PublisherName |
Comitato Elettrotecnico Italiano
|
| Status |
Current
|
| Standards | Relationship |
| EN 60749-44:2016 | Identical |
| BIS IS/IEC 61558-2-6 : 1ED 2016 | Identical |
| BIS IS/IEC 61558-2-6 : 1ED 2016 | Identical |
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