BS 6493-1.4:1992
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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Semiconductor devices. Discrete devices Recommendations for microwave diodes and transistors - Recommendations for microwave devices
Hardcopy , PDF
29-02-2008
English
28-06-2002
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Committees responsible
National foreword
Recommendations
Chapter I. General
1. Introductory note
2. Scope
3. Letter symbols
Chapter II. Variable capacitance, snap-off diodes and
fast-switching schottky diodes
Section 1. Variable capacitance diodes
1. General
2. Terminology and letter symbols
3. Essential ratings and characteristics
4. Measurement methods
Section 2. Snap-off diodes, Schottky diodes
1. General
2. Terminology and letter symbols
3. Essential ratings and characteristics
4. Measurement methods
Chapter III. Mixer diodes and detector diodes
Section 1. Mixer diodes used in radar applications
1. General
2. Terminology and letter symbols
3. Essential ratings and characteristics
4. Measurement methods
Section 2. Mixer diodes used in communication
applications
1. General
2. Terminology and letter symbols
3. Essential ratings and characteristics
4. Measurement methods
Section 3. Detector diodes
Chapter IV. Impatt diodes
Section 1. Impatt diodes amplifiers
1. General
2. Terminology and letter symbols
3. Essential ratings and characteristics
Section 2. Impatt diodes oscillators
Chapter V. Gunn diodes
1. General (under consideration)
2. Terminology and letter symbols
3. Essential ratings and characteristics (under
consideration)
4. Measurement methods
Chapter VI. Bipolar transistors
Chapter VII. Field effect transistors
1. General
2. Terminology and letter symbols
3. Essential ratings and characteristics
4. Measurement methods
Chapter VIII. Integrated circuit microwave
amplifiers
1. Terminology
2. Essential ratings and characteristics
3. Measuring methods
Chapter IX. Assessment and reliability -
Specific requirements
1 Electrical test conditions
2 Failure criteria and failure-defining
characteristics for acceptance tests
3 Failure criteria and failure-defining
characteristics for reliability tests
4 Procedure in case of a testing error
Supplies terminology and letter symbols, essential ratings and characteristics and measurement methods for several categories of microwave diodes and transistors, including variable capacitance diodes and snap-off diodes; mixer diodes and detector diodes; avalanche diodes; Gunn diodes; bipolar transistors; and field-effect transistors.
| Committee |
EPL/47
|
| DevelopmentNote |
Supersedes BS 3363:SUPP1(1981) and BS 3363:SUPP2(1981) (07/2002)
|
| DocumentType |
Standard
|
| Pages |
136
|
| PublisherName |
British Standards Institution
|
| Status |
Superseded
|
| SupersededBy | |
| Supersedes |
| BS 6493-1.1:1984 | Semiconductor devices. Discrete devices General |
| BS 6493-1.8:1985 | Semiconductor devices. Discrete devices Recommendations for field-effect transistors |
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