• BS 6493-1.1:1984

    Superseded A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

    Semiconductor devices. Discrete devices General

    Available format(s):  Hardcopy, PDF

    Superseded date:  30-06-2006

    Language(s):  English

    Published date:  15-05-2000

    Publisher:  British Standards Institution

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    Table of Contents - (Show below) - (Hide below)

    Committees responsible
    National foreword
    Chapter I. Scope and presentation of IEC
                  publications 747 and 748
    1 Publications 747
        1.1 Scope
        1.2 Presentation
    2 Publications 748
        2.1 Scope
        2.2 Presentation
    Chapter II. Purpose and presentation of publication
                  747-1
    1 Purpose
    2 Presentation
    Chapter III. Purpose, presentation and requirements
                  on the contents of publications 747-2,
                  747-3, etc.
    1 Purpose of each part
    2 Presentation of each part
        2.1 Subdivision into chapters
        2.2 Subdivision into device sub-categories
    3 Requirements on the different chapters of each part
        3.1 Requirements on Chapter I, General
              3.1.1 Purpose
        3.2 Requirements on Chapter II, Terminology and
              letter symbols
              3.2.1 Purpose
              3.2.2 Validity of terms, definitions and
                      letter symbols
              3.2.3 Letter symbols
        3.3 Requirements on Chapter III, Essential ratings
              and characteristics
              3.3.1 Purpose
        3.4 Requirements on Chapter IV, Measuring methods
              3.4.1 Purpose
        3.5 Requirements on Chapter V, Acceptance and
              reliability
              3.5.1 Purpose
    Chapter IV. Terminology, general
    1 Introduction
    2 Physical terms
    3 General terms
    4 Types of devices
    5 Terms related to ratings and characteristics
        5.1 Currents and voltages
        5.2 Temperatures
        5.3 Thermal characteristics
        5.4 Noise
        5.5 Various terms
        5.6 Terms characterizing the constant value or
              periodic waveforms of currents and voltages
    6 Pulse terms and definitions
    7 Input-to-output pulse switching times, general
        terms
    Chapter V. Letter symbols, general
    1 Introduction
    2 Letter symbols for currents, voltages and powers
    3 Letter symbols for electrical parameters
    4 Letter symbols for other quantities
    5 Letter symbols for logarithmic scale units for
        signal ratios expressed in dB
    Chapter VI. Essential ratings and characteristics,
                  general
    1 Introduction
    2 Standard format for the presentation of published
        data
    3 Definitions
    4 Definitions of cooling conditions
    5 List of recommended temperatures
    6 List of recommended voltages and currents
    7 Mechanical ratings, characteristics and other data
    8 Standardization of the position of terminals on
        bases of semiconductor devices
    9 Colour coding of terminals for semiconductor
        devices
    10 General information applicable to multiple devices
        having a common encapsulation
    11 Production spread and compliance
    12 Printed wiring and printed circuits
    Chapter VII. General and reference measuring methods,
                  general
    Section 1. General measuring methods
    1 Introduction
    2 General precautions
        2.1 Protection of devices and measuring
              equipment
        2.2 Accuracy of measurement
        2.3 Definitions
    Section 2. Reference measuring methods
    1 Guide for reference measuring methods
    2 Thermal conditions for electrical reference
        measuring methods
        2.1 Introduction
        2.2 Conditions in case of negligible power
              dissipation in the device
        2.3 Conditions in case of significant power
              dissipation in the device
    Chapter VIII. Acceptance and reliability of
                  discrete devices
    Section 1. General
    Section 2. General principles (Under consideration)
    Section 3. Electrical endurance tests
    1 Purpose and presentation
    2 General requirements
        2.1 Conditions for endurance tests
        2.2 Duration of test
        2.3 Failure-defining characteristics and
              measurements
        2.4 Failure criteria
        2.5 Precautions
    3 Specific requirements. General
        3.1 List of endurance tests
        3.2 Conditions for endurance tests
        3.3 Failure-defining characteristics and failure
              criteria for acceptance after endurance tests
        3.4 Failure-defining characteristics and failure
              criteria for reliability tests (under
              consideration)
        3.5 Procedure in case of a testing error
        3.6 Information to be given in Table I and Table II
    Chapter IX. Electrostatic-sensitive devices
    1 Handling precautions
    2 Label and symbol
    3 Test methods for electronic devices sensitive to
        voltage pulses of short duration

    Abstract - (Show below) - (Hide below)

    General recommendations for discrete semiconductor devices, including integrated circuits.

    General Product Information - (Show below) - (Hide below)

    Committee EPL/47
    Development Note Also numbered as IEC 60747-1 (09/2005)
    Document Type Standard
    Publisher British Standards Institution
    Status Superseded
    Superseded By

    Standards Referenced By This Book - (Show below) - (Hide below)

    BS 6493-2.1:1985 Semiconductor devices. Integrated circuits General
    BS 6493-2.2(1986) : 1986 SEMICONDUCTOR DEVICES - INTEGRATED CIRCUITS - RECOMMENDATIONS FOR DIGITAL INTEGRATED CIRCUITS
    BS CECC 90000:1991 Harmonized system of quality assessment for electronic components. Generic specification: monolithic integrated circuits
    BS IEC 60747-10:1991 Semiconductor devices Generic specification for discrete devices and integrated circuits
    BS QC 790303:1994 Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. Linear digital-to-analogue converters (DAC)
    BS EN 190000:1996 Harmonized system of quality assessment for electronic components. Generic specification: monolithic integrated circuits
    BS 6493-1.7:1989 Semiconductor devices. Discrete devices Recommendations for bipolar transistors
    BS 6493-1.2:1984 Semiconductor devices. Discrete devices Recommendations for rectifier diodes
    BS QC 750107:1991 Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Case-rated bipolar transistors for high-frequency amplifications
    BS 6493-3:1985 Semiconductor devices Mechanical and climatic test methods
    BS 6493-1.5:1992 Semiconductor devices. Discrete devices Recommendations for optoelectronic devices - Section 5: Recommendations for optoelectronic devices
    BS CECC 90200:1988 Harmonized system of quality assessment for electronic components: sectional specification: analogue monolithic integrated circuits
    BS CECC 90300:1988 Harmonized system of quality assessment for electronic components. Sectional specification: interface monolithic integrated circuits
    BS QC 790202:1991 Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. Monolithic integrated operational amplifiers
    BS 6493-1.4:1992 Semiconductor devices. Discrete devices Recommendations for microwave diodes and transistors - Recommendations for microwave devices
    BS 6062-4(1991) : 1991 AMD 9687 PACKAGING OF ELECTRONIC COMPONENTS FOR AUTOMATIC HANDLING - SPECIFICATION FOR STICK MAGAZINES FOR DUAL-IN-LINE PACKAGES
    BS EN 120000:1996 Harmonized system of quality assessment for electronic components. General specification: semiconductor optoelectronic and liquid crystal devices
    BS 6493-1.6:1984 Semiconductor devices. Discrete devices Recommendations for thyristors
    BS 6493-2.3:1987 Semiconductor devices. Integrated circuits Recommendations for analogue integrated circuits
    BS QC 750106:1993 Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Field-effect transistors for case-rated power amplifier applications
    BS QC 720100:1991 Harmonized system of quality assessment for electronic components. Semiconductor devices. Sectional specification for optoelectronic devices
    BS 6493-1.8:1985 Semiconductor devices. Discrete devices Recommendations for field-effect transistors
    BS 6493-1.5(1985) : 1985 SEMICONDUCTOR DEVICES - DISCRETE DEVICES - RECOMMENDATIONS FOR OPTOELECTRONIC DEVICES
    BS QC700000(1991) : 1991 HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRIC COMPONENTS - GENERIC SPECIFICATION FOR DISCRETE DEVICES AND INTEGRATED CIRCUITS
    BS QC 790304:1994 Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. Linear analogue-to-digital converters (ADC)
    BS QC 760000:1990 Harmonized system of quality assessment for electronic components. Film and hybrid film integrated circuits. Generic specification
    BS QC 790104:1992 Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Family specification. Complementary MOS digital integrated circuits, series 4000 B and 4000 UB
    BS 6493-1.3:1986 Semiconductor devices. Discrete devices Recommendations for signal (including switching) and regulator diodes
    BS 6493-2.4(1989) : 1989 SEMICONDUCTOR DEVICES - INTEGRATED CIRCUITS - RECOMMENDATIONS INTERFACE INTEGRATED CIRCUITS
    BS CECC 90115:1994 Specification for harmonized system of quality assessment for electronic components. Blank detail specification: digital gate array integrated circuits
    EN 190000:1995 Generic Specification: Monolithic integrated circuits
    BS 5783:1987 Code of practice for handling of electrostatic sensitive devices

    Standards Referencing This Book - (Show below) - (Hide below)

    IEC 60134:1961 Rating systems for electronic tubes and valves and analogous semiconductor devices
    BS 6493-2.1:1985 Semiconductor devices. Integrated circuits General
    BS 2045:1965 Preferred numbers
    BS 6493-2.4(1989) : 1989 SEMICONDUCTOR DEVICES - INTEGRATED CIRCUITS - RECOMMENDATIONS INTERFACE INTEGRATED CIRCUITS
    BS 6493-2.2(1986) : 1986 SEMICONDUCTOR DEVICES - INTEGRATED CIRCUITS - RECOMMENDATIONS FOR DIGITAL INTEGRATED CIRCUITS
    BS 4727(1971) : LATEST
    BS 3934:1965 Specification for dimensions of semiconductor devices and integrated electronic circuits
    BS 2011(1967) : LATEST
    BS 4200-3:1979 Guide on the reliability of electronic equipment and parts used therein Presentation of reliability data on electronic components (or parts)
    BS 6493-2.3:1987 Semiconductor devices. Integrated circuits Recommendations for analogue integrated circuits
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