BS 9450:1975
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
View Superseded by
Specification for integrated electronic circuits and micro-assemblies of assessed quality (capability approval procedures): generic data and methods of test
Hardcopy , PDF
15-03-1998
English
31-10-1975
Cooperating organizations
Specification
0. Introduction
Section one. Principles and mandatory requirements
1.1 General matters
1.1.1 Scope
1.1.2 Related documents
1.1.3 Terminology
1.1.3.1 General terms
1.1.3.2 Integrated circuits and their functions
1.1.3.3 General descriptive terms
1.1.3.4 Terms for the characteristics of digital
circuits
1.1.3.5 Terms for the characteristics of analogue
circuits
1.1.4 Letter symbols, signs and abbreviations
1.1.4.1 Digital circuits
1.1.5 Graphical symbols
1.1.6 Marking of the component and package
1.1.6.1 Terminal identification
1.1.6.2 Customer's type number (or colour code)
1.1.6.3 Factory identification code or manufacturer's
name or trade mark
1.1.6.4 Date code
1.1.6.5 Text deleted
1.1.6.6 Detail specification number
1.1.6.7 Colour code identification for type number
1.1.7 Eligibility for release
1.1.7.1 Film and hybrid integrated circuits, micro-
assemblies, micro-modules and microwave
integrated circuits
1.1.7.2 Monolithic and multichip semiconductor
circuits
1.1.7.3 Use of non-approved sub-contractors
1.1.8 Structural similarity
1.1.9 Delayed delivery
1.1.10 Supplementary procedure for qualification
approval
1.1.11 Certified test records
1.1.12 Standard ratings and characteristics
1.1.12.1 Supply terminal voltages
1.1.12.2 Test temperatures
1.1.12.3 Preferred temperature ranges
1.1.13 Unchecked parameters
1.1.14 Procedure to be followed in the event of
failure at groups C and D inspection
1.1.15 Ordering information
1.1.16 Release prior to completion of group B tests
1.1.17 Supplementary procedure for reduced
inspection
1.1.18 Supplementary procedure for general
application category components
1.1.19 Rework
1.2 Test procedures
1.2.1 Standard conditions for testing
1.2.1.1 General
1.2.1.2 Safety aspects
1.2.1.3 Drying
1.2.2 External visual inspection
1.2.3 Dimensioning and gauging procedures
1.2.4 Electrical test procedures
1.2.4.1 General
1.2.4.2 Measurement methods
1.2.5 Mechanical test procedures
1.2.5.1 Direction of acceleration/force
1.2.6 Environmental test procedures
1.2.6.1 Cold
1.2.6.2 Dry heat
1.2.6.3 High temperature storage
1.2.6.4 Damp heat, steady state
1.2.6.5 Damp heat, accelerated/cyclic
1.2.6.6 Shock
1.2.6.7 Bump
1.2.6.8 Vibration (sinusoidal)
1.2.6.9 Acceleration steady state
1.2.6.10 Mould growth
1.2.6.11 Corrosion
1.2.6.12 Low air pressure
1.2.6.13 Rapid change of temperature
1.2.6.14 Sealing
1.2.6.15 Soldering
1.2.6.16 Robustness of terminations
1.2.6.17 Flammability
1.2.6.18 Immersion in cleaning solvents
1.2.6.19 Rapid change of temperature, two-bath method
1.2.6.20 Text deleted
1.2.6.21 Damp heat steady state with bias
1.2.6.22 Thermal intermittance test
1.2.7 Electrical endurance test procedures
1.2.7.1 General
1.2.7.2 Test conditions
1.2.7.3 Specified conditions
1.2.8 Accelerated test procedures
1.2.8.1 Thermally accelerated test for thick film
resistive elements and associated conductors
1.2.8.2 Damp heat accelerated test for long term
changes in resistance and interconductor
leakage
1.2.9 Screening test procedures
1.2.9.0 Introduction
1.2.9.1 Screening requirements
1.2.9.2 Burn-in screen
1.2.10 Internal visual inspection
1.2.10.0 Introduction
1.2.10.1 Pre-assembly inspection
1.2.10.2 Post-assembly inspection
1.2.11 Measurement of conductor adhesion to substrate
1.2.11.1 Pull test
1.2.11.2 Peel test
1.3 Capability approval and maintenance procedures
1.3.1 Capability assessment
1.3.2 Description of capability: Capability manual
1.3.3 Programme for initial capability approval
and extensions
1.3.4 Performance of capability approval programme
1.3.5 Abstract of description of capability
1.3.6 Maintenance of capability approval
1.3.6.1 Small production lots
1.3.6.2 Capability qualifying circuits
1.3.6.3 Inspection requirements for maintenance of
capability
1.3.7 Capability approval report
1.3.8 Review, suspension and withdrawal of
capability approval
1.3.8.1 Review of approval
Text deleted
1.4 Inspection to the customer's detail
specification
Section two. Guidance on the preparation of customers'
detail specifications
2.1 Basic information
2.1.1 Originator of the detail specification
2.1.2 Numbering of the detail specification
2.1.3 Description of the circuit and its intended
application
2.1.4 Outline drawing and dimensions
2.1.5 Limiting conditions of use (ratings)
2.1.6 Required conditions of use and associated
characteristics
2.1.7 Related documents
2.1.8 Additional information
2.1.9 Ordering instructions
2.2 Quality conformance inspection requirements
2.2.1 Screening requirements
2.2.2 Post-sealing test requirements
2.2.3 Electrical endurance tests
2.2.4 Electrical performance tests
2.2.5 Environmental tests
2.3 Certified test records
2.4 Authentication
Section three. Manufacturer's guidance to customers
3.1 Introduction
3.2 Circuit technology
3.3 Materials, construction and packages
3.4 Policy and information on design data and
layout rules
3.4.1 Circuit elements
3.4.1.1 Resistors
3.4.1.2 Capacitors
3.4.1.3 Diodes
3.4.1.4 Transistors
3.4.2 Substrates for film circuits
3.4.3 Interconnection tracks and bonding pads
3.4.4 Circuit layout
3.4.5 Art work
3.4.6 Mask and screen preparation
3.4.7 Substrate preparation
3.5 Quality conformance inspection schedules
3.5.1 Pre-assembly inspection
3.5.2 Post-assembly inspection
3.5.3 Post-sealing inspection (environmental)
3.5.4 Electrical endurance inspection
3.5.5 Electrical performance inspection
3.6 Screening options
3.6 Add-on components
3.8 Capability qualifying circuits
3.9 Guidance on the ratings and characteristics
which the customer should specify
Appendix
A. Guide to the writing of a customer's detail
specification for a hybrid circuit
Requirements for a system of capability approval of manufacturers which is analogous to a manufacturer receiving qualification approval for a series of stucturally similar components.
Committee |
EPL/47
|
DevelopmentNote |
Supersedes 73/29006 DC, 84/27670 DC and 87/21237 DC (10/2005) Inactive for the new design. (02/2006)
|
DocumentType |
Standard
|
Pages |
104
|
PublisherName |
British Standards Institution
|
Status |
Superseded
|
SupersededBy | |
Supersedes |
BS 9000-6:1989 | General requirements for a system for electronic components of assessed quality Specification of capability approval procedures |
BS 5295-3:1976 | Environmental cleanliness in enclosed spaces Guide to operational procedures and disciplines applicable to clean rooms, work stations and clean air devices |
BS 9000(1967) : LATEST | |
BS 9420:1972 | Rules for the preparation of detail specifications for integrated circuits of assessed quality: TTL digital bistable circuits. General application category |
BS 9400:1970 | Specification for integrated electronic circuits and micro-assemblies of assessed quality (qualification approval procedures): generic data and methods of test |
BS 9444:1974 | Rules for the preparation of detail specifications for integrated circuits of assessed quality: insulated gate shift registers. General application category |
BS 9300:1969 | Specification for semiconductor devices of assessed quality: generic data and methods of test |
BS 9460:1974 | Rules for the preparation of detail specifications for integrated circuits of assessed quality: differential operational amplifiers. General application category |
BS 9404:1972 | Rules for the preparation of detail specifications for integrated circuits of assessed quality: DTL digital inverter circuits. General application category |
BS 9403:1972 | Rules for the preparation of detail specifications for integrated circuits of assessed quality: TTL digital inverter circuits. General application category |
BS 9470:1980 | Rules for the preparation of detail specifications for integrated circuits of assessed quality: microwave amplifiers. Full assessment level |
BS 9401:1970 | Rules for the preparation of detail specifications for integrated circuits of assessed quality: TTL digital gate circuits. General application category |
BS 9440:1973 | Rules for the preparation of detail specifications for integrated circuits of assessed quality: complex digital circuits - bipolar. General application category |
BS 9405:1972 | Rules for the preparation of detail specifications for integrated circuits of assessed quality: TTL digital interconnected gate circuits. General application category |
BS 6493-3:1985 | Semiconductor devices Mechanical and climatic test methods |
BS 9430:1978 | Rules for the preparation of detail specifications for integrated circuits of assessed quality: voltage regulators. Full assessment level |
BS 9494:1981 | Rules for the preparation of detail specifications for fusible link programmable read-only memories of assessed quality (full assessment level) |
BS 9461:1974 | Rules for the preparation of detail specifications for integrated circuits of assessed quality: differential comparator amplifiers. General application category |
BS 9407(1973) : LATEST | RULES FOR THE PREPARATION OF DETAIL SPECIFICATIONS FOR INTEGRATED CIRCUITS OF ASSESSED QUALITY. ECL DIGITAL GATE CIRCUITS. GENERAL APPLICATION CATEGORY |
BS 9462(1974) : LATEST | RULES FOR THE PREPARATION OF DETAIL SPECIFICATIONS FOR INTEGRATED CIRCUITS OF ASSESSED QUALITY:WIDEBAND VIDEO AMPLIFIERS. GENERAL APPLICATION CATEGORY |
BS 9442:1973 | Rules for the preparation of detail specifications for integrated circuits of assessed quality: TTL binary counter circuits. General application category |
BS 5295-2:1976 | Environmental cleanliness in enclosed spaces Guide to the construction and installation of clean rooms, work stations and clean air devices |
BS 3363:1968 | Schedule of letter symbols for semiconductor devices. |
BS 9491:1975 | Rules for the preparation of detail specifications for analogue integrated circuits of assessed quality. Full assessment level |
BS 3934:1965 | Specification for dimensions of semiconductor devices and integrated electronic circuits |
BS 9493:1981 | Rules for the preparation of detail specifications for integrated circuits of assessed quality which perform mixed digital and/or analogue functions |
BS 9490:1975 | Rules for the preparation of detail specifications for digital integrated circuits of assessed quality. Full assessment level |
BS 5295-4:1989 | Environmental cleanliness in enclosed spaces Specification for monitoring clean rooms and clean air devices to prove continued compliance with BS 5295:Part 1 |
IEC 60148:1969 | Letter symbols for semiconductor devices and integrated microcircuits |
BS 9443:1974 | Rules for the preparation of detail specifications for integrated circuits of assessed quality: TTL binary memory circuits. General application category |
BS 9406(1973) : LATEST | RULES FOR THE PREPARATION OF DETAIL SPECIFICATIONS FOR INTEGRATED CIRCUITS OF ASSESSED QUALITY:INSULATED GATE DIGITAL CIRCUITS. GENERAL APPLICATION CATEGORY |
BS 5295-1:1976 | Environmental cleanliness in enclosed spaces Specification for controlled environment clean rooms, work stations and clean air devices |
BS 9492:1978 | Rules for the preparation of detail specifications for capacitively coupled digital integrated circuits of assessed quality. Full assessment level |
BS 2011(1967) : LATEST | |
BS 3591(1963) : AMD 2504 | |
BS 9402:1972 | Rules for the preparation of detail specifications for integrated circuits of assessed quality: DTL digital gate circuits (general application category) |
BS PD9002(1976) : LATEST |
Access your standards online with a subscription
Features
-
Simple online access to standards, technical information and regulations.
-
Critical updates of standards and customisable alerts and notifications.
-
Multi-user online standards collection: secure, flexible and cost effective.