BS 9610:1982
Withdrawn
A Withdrawn Standard is one, which is removed from sale, and its unique number can no longer be used. The Standard can be withdrawn and not replaced, or it can be withdrawn and replaced by a Standard with a different number.
Specification for quartz crystal units of assessed quality: generic data and methods of test
Hardcopy , PDF
15-09-1999
English
29-10-1982
Foreword
Cooperating organizations
Specification
Section one. Principles and mandatory procedures
1.1 General matters
1.1.1 Scope
1.1.2 Related documents
1.1.3 Terminology
1.1.4 Letter symbols, signs and abbreviations
1.1.5 Graphical symbols
1.1.6 Marking of the component and package
1.1.6.1.1 Marking and identification code for quartz
crystal units
1.1.7 Eligibility for qualification approval
1.1.8 Structurally similar components
1.1.8.1 Inspection of structurally similar components
1.1.9 Delayed delivery
1.1.10 Supplementary procedures for qualification
approval (of thickness shear mode crystal
units only)
1.1.11 Certified test records
1.1.12 Standard ratings and characteristics
1.1.12.1 Operating temperature ranges
1.1.12.2 Frequency tolerances
1.1.12.3 Circuit conditions
1.1.12.4 Levels of drive
1.1.12.5 Climatic category
1.1.12.6 Bump severity
1.1.12.7 Vibration severity
1.1.12.8 Shock severity
1.1.12.9 Leak rate
1.1.13 Procedure to be followed in the event of
failures at group C or D inspection
1.1.14 Ordering information
1.1.15 Release prior to completion of group B tests
1.2 Test procedures
1.2.1 Test measurement conditions
1.2.2 Visual inspection
1.2.2.1 Visual test A
1.2.2.2 Visual test B
1.2.2.3 Visual test C
1.2.2.4 Visual test D
1.2.3 Dimensioning and gauging procedures
1.2.3.1 Dimensions test A
1.2.3.2 Dimensions test B
1.2.4 Electrical test procedures
1.2.4.1 Frequency and resonance resistance
1.2.4.2 Frequency and resonance resistance as a
function of drive level
1.2.4.3 Frequency and resonance resistance as a
function of temperature
1.2.4.4 Unwanted responses
1.2.4.5 Shunt capacitance
1.2.4.6 Load resonance frequency and resistance
1.2.4.7 Frequency pulling range
1.2.4.8 Insulation resistance
1.2.5 Mechanical test procedures
1.2.6 Mechanical and environmental test procedures
1.2.6.1 Robustness of terminations
1.2.6.2 Sealing tests
1.2.6.3 Solderability
1.2.6.4 Rapid change of temperature: severe shock by
liquid immersion
1.2.6.5 Rapid change of temperature: thermal shock in
air
1.2.6.6 Bump
1.2.6.7 Vibration
1.2.6.8 Shock
1.2.6.9 Acceleration, steady state
1.2.6.10 Climatic sequence
1.2.6.11 Damp heat, steady state
1.2.7 Endurance test procedure
1.2.7.1 Ageing
1.2.7.2 Shelf life
Section two. Procedures for the preparation of detail
specifications
2.1 Basic information
2.1.1 The originator of the detail specification
2.1.2 The number of the detail specification
2.1.3 Description of the component and intended
application
2.1 4 Outline drawing
2.1.5 Ratings
2.1.6 Characteristics
2.1.7 Related documents
2.1.8 Additional information (not for inspection
purposes)
2.1.9 Ordering information
2.2 Inspection requirements
2.3 Certified test records
2.3.1 General information
2.3.2 Measurements information
2.3.3 Explanatory information
Appendices
A Preferred method for the measurement of
resonance frequency fr and the resonance
resistance Rr over the frequency range 1 MHz
to 200 MHz
B Method for the measurement of the motional
parameters of crystal units at frequencies
below 1 MHz
C Terminal bend test and tool
D Example of a certified test record
E Code letters for frequency tolerances and
operating temperature ranges
Tables
1 Examples of ageing test results for subgroup
C5 in June to December 1982
2 Examples of shelf life test results for
subgroup D5 in February to December 1982
3 Code letters for frequency tolerances and
operating temperature ranges
Figures
1 Equivalent electric circuit of a
piezoelectric vibrator near a resonance
2 Resonance, anti-resonance and load resonance
frequencies
3 Schematic of measuring circuit
4 Circuit diagram of pi-network
5 Plot showing the phase change from the value
at 25 ohms versus reference resistor values
from 0 ohms to 100 ohms at 10 MHz, 50 MHz,
100 MHz and 200 MHz
6 Typical pi-network
7 Details of pi-network assembly
8 Dimensions of contacting plates and earthed
shield
9 Position of the reference resistor with
respect to the pi-network contacting plates
10 Reference resistors
11 Power splitter
12 Phase/frequency response with a 25 ohm
reference resistor
13 Schematic of transmission circuit
14 Terminal bend test tool
Essential test requirements and other general information relating to quartz crystal units. Intended to be used in conjunction with other relevant detail specifications in the BS 9000 series.
Committee |
W/-
|
DevelopmentNote |
REPLACES BS 2271:PART 1: 1964
|
DocumentType |
Standard
|
Pages |
38
|
PublisherName |
British Standards Institution
|
Status |
Withdrawn
|
Supersedes |
Standards | Relationship |
CECC 68000 : 1989 AMD 2 1993 | Similar to |
CECC 68200 : 90 AMD 1 93 | Similar to |
BS 2011-2.1N:1985 | Environmental testing. Tests Test N. Change of temperature |
BS 2011-2.1Ca:1977 | Environmental testing. Tests Test Ca. Damp heat, steady state |
BS 5069-1:1980 | Dimensions of piezoelectric devices Specification for standard outlines and pin connections for quartz crystal units |
IEC 60444:1973 | Basic method for the measurement of resonance frequency and equivalent series résistance of quartz crystal units by zero phase technique in a pi-network |
BS 9000-2:1991 | General requirements for a system for electronic components of assessed quality Specification for the national implementation of the CECC system |
IEC 60302:1969 | Standard definitions and methods of measurement for piezoelectric vibrators operating over the frequency range up to 30 MHz |
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