BS EN 50324-1:2002
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Piezoelectric properties of ceramic materials and components Terms and definitions |
BS EN 60444-2:1997
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Measurement of quartz crystal unit parameters Phase offset method for measurement of motional capacitance of quartz crystal units |
BS CECC68000(1990) : AMD 9184
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HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS: GENERIC SPECIFICATION: QUARTZ CRYSTAL UNITS |
EN 60444-5:1997
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Measurement of quartz crystal unit parameters - Part 5: Methods for the determination of equivalent electrical parameters using automatic network analyzer techniques and error correction |
EN 50324-1:2002
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Piezoelectric properties of ceramic materials and components - Part 1: Terms and definitions |
BS EN 60444-4:1997
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Measurement of quartz crystal unit parameters Method for the measurement of the load resonance frequency fL, load resonance resistance RL and the calculation of other derived values of quartz crystal units, up to 30 MHz |
IEC 61253-1:1993
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Piezoelectric ceramic resonators - A specification in the IEC quality assessment system for electronic components (IECQ) - Part 1: Generic specification - Qualification approval |
IEC 60444-5:1995
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Measurement of quartz crystal units parameters - Part 5: Methods for the determination of equivalent electrical parameters using automatic network analyzer techniques and error correction |
MIL STD 1547 : B
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ELECTRONIC PARTS, MATERIALS, AND PROCESSES FOR SPACE VEHICLES |
BS EN 168000:1996
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Harmonized system of quality assessment for electronic components. Generic specification: quartz crystal units |
BS 9610:1982
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Specification for quartz crystal units of assessed quality: generic data and methods of test |
NF EN 50324-1 : 2002
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PIEZOELECTRIC PROPERTIES OF CERAMIC MATERIALS AND COMPONENTS - PART 1: TERMS AND DEFINITIONS |
MIL C 49468 : 0
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CRYSTAL UNITS, QUARTZ, PRECISION, GENERAL SPECIFICATION FOR |
BS EN 61028:1993
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ELECTRICAL MEASURING INSTRUMENTS - X-Y RECORDERS |
IEC 61178-1:1993
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Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 1: Generic specification |
IEC 60642-2:1994
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Piezoelectric ceramic resonator units - Part 2: Guide to the use of piezoelectric ceramic resonator units |
DIN IEC 60444-2:1992-11
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MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS BY ZERO PHASE TECHNIQUE IN A PI NETWORK; PHASE OFFSET METHOD FOR MEASUREMENT OF MOTIONAL CAPACITANCE OF QUARTZ CRYSTAL UNITS |
DIN IEC 60444-4:1992-11
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MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS BY ZERO PHASE TECHNIQUE IN A PI NETWORK; METHOD FOR THE MEASUREMENT OF LOAD RESONANCE FREQUENCY FL, LOAD RESONANCE RESISTANCE RL AND THE CALCULATION OF OTHER DERIVED VALUES OF QUARTZ CRYSTAL UNITS UP TO 30 MHZ |
14/30265605 DC : 0
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BS ISO 17859 - FINE CERAMICS (ADVANCED CERAMICS, ADVANCED TECHNICAL CERAMICS) - MEASUREMENT METHOD OF PIEZOELECTRIC STRAIN AT HIGH ELECTRIC FIELD |
BS EN 60444-5:1997
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Measurement of quartz crystal unit parameters Methods for the determination of equivalent electrical parameters using automatic network analyzer techniques and error correction |
I.S. EN 50324-1:2002
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PIEZOELECTRIC PROPERTIES OF CERAMIC MATERIALS AND COMPONENTS - PART 1: TERMS AND DEFINITIONS |
I.S. EN 168000:1994
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QUARTZ CRYSTAL UNITS (GENERIC SPECIFICATION) |