BS CECC 32200:1989
Superseded
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Harmonized system of quality assessment for electronic components. Sectional specification: fixed chip capacitors with metallized electrodes and polyethylene-terephthalate dielectric for direct current
Hardcopy , PDF
30-06-2006
English
28-02-1989
Foreword
Preface
Section 1 - General
1.1 Scope
1.2 Related documents
1.3 Information to be given in a detail specification
1.4 Terminology
1.5 Marking
Section 2 - Preferred ratings and characteristics
2.1 Preferred climatic categories
2.2 Preferred values of ratings
Section 3 - Quality assessment procedures
3.1 Primary stage of manufacture
3.2 Structurally similar components
3.3 Certified test records
3.4 Qualification approval
3.5 Quality conformance inspection
Section 4 - Tests and measuring methods
4.1 Mounting
4.2 Visual examination and check of dimensions
4.3 Electrical tests
4.4 Adhesion
4.5 Bond strength of end face plating
4.6 Resistance to soldering heat
4.7 Solderability
4.8 Rapid change of temperature
4.9 Climatic sequence
4.10 Damp heat, steady state
4.11 Endurance
4.12 Robustness of terminations
Appendix A: Test schedule for Qualification Approval
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