BS CECC 63101:1985
Current
Current
The latest, up-to-date edition.
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: film and hybrid integrated circuits
Available format(s)
Hardcopy , PDF
Language(s)
English
Published date
15-01-1985
Publisher
Important note : Users cannot be edited or removed once added to your Multi user PDF.Provides general conditions, ratings (limiting values), characteristics, test conditions and inspection requirements for a range of film and hybrid integrated circuits.
| Committee |
EPL/47
|
| DevelopmentNote |
Inactive for the new design. (01/2006)
|
| DocumentType |
Standard
|
| Pages |
16
|
| PublisherName |
British Standards Institution
|
| Status |
Current
|
| Standards | Relationship |
| CECC 63101 : 84 AMD 1 | Identical |
| BS CECC 63100:1985 | Harmonized system of quality assessment for electronic components: sectional specification: film and hybrid integrated circuits |
| BS 9300:1969 | Specification for semiconductor devices of assessed quality: generic data and methods of test |
| BS 9000-2(1996) : 1996 | GENERAL REQUIREMENTS FOR A SYSTEM FOR ELECTRONIC COMPONENTS OF ASSESSED QUALITY - SPECIFICATION FOR THE NATIONAL IMPLEMENTATION OF THE CECC SYSTEM |
| BS 6001(1972) : AMD 5054 | SAMPLING PROCEDURES FOR INSPECTION BY ATTRIBUTES - SPECIFICATION FOR SAMPLING PLANS INDEXED BY ACCEPTABLE QUALITY LEVEL (AQL) FOR LOT - BY - LOT INSPECTION |
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