BS EN 116300:1994
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Harmonized system of quality assessment for electronic components. Sectional specification: electromechanical all-or-nothing heavy load relays of assessed quality (rated from 5A and above) |
DEFSTAN 66-31(PT1)/2(2008) : 2008
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BASIC REQUIREMENTS AND TESTS FOR ELECTRONIC AND ELECTRICAL TEST AND MEASUREMENT EQUIPMENT - PART 1: INTRODUCTION AND GUIDE TO THE SPECIFICATION AND SELECTION OF TEST AND MEASUREMENT EQUIPMENT BY THE PROCURING AUTHORITY |
DEFSTAN 66-31(PT2)/1(2007) : 2007
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BASIC REQUIREMENTS & TESTS FOR ELECTRONIC & ELECTRICAL TEST & MEASUREMENT EQUIPMENT - PART 2: CONTRACTOR GENERAL REQUIREMENTS |
BS 9000-3:1996
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General requirements for a system for electronic components of assessed quality Specification for the national implementation of the IECQ system |
EN 196500:1993/A1:2001
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SECTIONAL SPECIFICATION: MEMBRANE SWITCHES INCLUDING BLANK DETAIL SPECIFICATION EN 196501 |
DEFSTAN 02-514/2(2008) : 2008
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GUIDE TO CABLE ENTRY, TERMINATION AND JUNCTION COMPONENTS FOR EQUIPMENT |
BS CECC 90202:1985
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Specification for harmonized system of quality assessment for electronic components. Blank detail specification: integrated operational amplifiers |
DEFSTAN 00-00(PT1)/3(1999) : 1999
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STANDARDS FOR DEFENCE - PART 1: MOD UK STANDARDISATION POLICY, ORGANIZATIONS AND IMPLEMENTATION |
BS CECC 20000:1983
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Harmonized system of quality assessment for electronic components: generic specification: semiconductor optoelectronic and liquid crystal devices |
BS CECC 90202:1990
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Specification for harmonized system of quality assessment for electronic components. Blank detail specification: integrated operational amplifiers |
DEFSTAN 66-31(PT1)/1(2007) : 2007
|
BASIC REQUIREMENTS & TESTS FOR ELECTRONIC & ELECTRICAL TEST & MEASUREMENT EQUIPMENT - PART 1: INTRODUCTION AND GUIDE TO THE SPECIFICATION AND SELECTION OF TEST AND MEASUREMENT EQUIPMENT BY THE PROCURING AUTHORITY |
DEFSTAN 66-31(PT2)/2(2008) : 2008
|
BASIC REQUIREMENTS & TESTS FOR ELECTRONIC & ELECTRICAL TEST & MEASUREMENT EQUIPMENT - PART 2: CONTRACTOR GENERAL REQUIREMENTS |
BS CECC 30500:1989
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Harmonized system of quality assessment for electronic components. Sectional specification: fixed metallized polycarbonate film dielectric capacitors for direct current |
BS CECC 90111:1987
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Specification for harmonized system of quality assessment for electronic components. Blank detail specification. MOS read/write static memories silicon monolithic circuits |
BS EN 168101:1997
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Harmonized system of quality assessment for electronic components. Blank detail specification: quartz crystal units (capability approval) |
BS EN 123400:1992
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Harmonized system of quality assessment for electronic components. Sectional specification: flexible printed boards without through connections |
BS EN 150001:1993
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Specification for harmonized system of quality assessment for electronic components. Blank detail specification: general purpose semiconductor diodes |
BS EN 114001:1997
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Harmonized system of quality assessment for electronic components. Blank detail specification: photomultiplier tubes |
BS E9065:1976
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Specification for harmonized system of quality assessment for electronic components. Blank detail specification: small power transmitting tubes of anode dissipation up to 1 kW |
BS EN 111100:1992
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Harmonized system of quality assessment for electronic components: sectional specification: display storage tubes |
BS CECC 90109:1986
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Specification for harmonized system of quality assessment for electronic components. Family specification. Digital integrated HC MOS circuits series HC/HCT/HCU |
BS EN 123500-800:1992
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Harmonized system of quality assessment for electronic components. Capability detail specification: flexible printed boards with through-connections |
BS CECC 63000:1990
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Harmonized system of quality assessment for electronic components. Generic specification: film and hybrid integrated circuits |
BS EN 123400-800:1992
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Harmonized system of quality assessment for electronic components. Capability detail specification: flexible printed boards without through-connections |
BS CECC 00802:1994
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Harmonized system of quality assessment for electronic components. Guidance document: CECC Standard method for the specification of surface mounting components (SMDs) of assessed quality |
BS E9375:1975
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Specification. Harmonized system of quality assessment for electronic components. Blank detail specification: voltage regulator diodes and voltage reference diodes excluding precision-voltage temperature-compensated reference diodes |
BS CECC 90112:1987
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Specification for harmonized system of quality assessment for electronic components. Blank detail specification. MOS read/write dynamic memories silicon monolithic circuits |
BS CECC 51001:1987
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Specification for harmonized system of quality assessment for electronic components. Blank detail specification: mercury wetted change-over contact units, magnetically biased |
BS EN 120003:1993
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Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Phototransistors, photodarlington transistors, phototransistor arrays |
BS 9523:1984
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Rules for the preparation of detail specifications for rectangular electrical connectors of assessed quality with integral metal housings for d.c. and low frequency applications. Full and basic assessment levels |
BS EN 120006:1993
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Specification for harmonized system of quality assessment for electronic components. Blank detail specification: pin-photodiodes for fibre optic applications |
BS CECC 90114:1990
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Specification for harmonized system of quality assessment for electronic components. Blank detail specification: programmable logic arrays (PLA) |
BS EN 120004:1993
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Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Ambient rated photocouplers with phototransistor output |
BS CECC 200000:1993
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Harmonized system of quality assessment for electronic components. Requirements for process assessment schedules for process approval |
BS CECC 30501:1993
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Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Fixed metallized polycarbonate film dielectric capacitors for direct current |
BS CECC 90302:1986
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Specification for harmonized system of quality assessment for electronic components. Blank detail specification: integrated voltage comparators |
BS CECC 63201:1985
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Specification for harmonized system of quality assessment for electronic components. Blank detail specification: film and hybrid integrated circuits (capability approval) |
BS EN 114000:1993
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Harmonized system of quality assessment for electronic components: generic specification: photomultiplier tubes |
BS CECC 17001:1984
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Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Mercury wetted make contact units for general application |
BS CECC 90203:1985
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Specification for harmonized system of quality assessment for electronic components. Blank detail specification: integrated analogue switching circuits |
BS EN 190101:1994
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Specification for harmonized system of quality assessment for electronic components. Family specification: digital integrated TTL circuits series 54, 64, 74, 84 |
BS EN 116200:1997
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Harmonized system of quality assessment for electronic components. Sectional specification. Electromechanical all-or-nothing relays (including relays for severe environmental conditions) |
BS CECC 75201:1992
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Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Interim example. Detail specification/blank detail specification. Circular connectors for frequencies below 3 MHz |
BS EN 190103:1994
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Specification for harmonized system of quality assessment for electronic components. Family specification: digital integrated TTL low power SCHOTTKY, circuits, series 54LS, 64LS, 74LS, 84LS |
BS CECC 63101:1985
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Specification for harmonized system of quality assessment for electronic components. Blank detail specification: film and hybrid integrated circuits |
BS EN 169000:1993
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Harmonized system of quality assessment for electronic components. Generic specification. Quartz crystal controlled oscillators |
BS EN 196500:1993
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Harmonized system of quality assessment for electronic components. Sectional specification. Membrane switches including blank detail specification EN 196501 |
BS E9063:1976
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Specification for harmonized system of quality assessment for electronic components. Blank detail specification: industrial heating triodes |
BS EN 125400:1993
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Harmonized system of quality assessment for electronic components: sectional specification: adjusters used with magnetic oxide cores for use in inductors and tuned transformers |
BS EN 150011:1993
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Specification for harmonized system of quality assessment for electronic components. Blank detail specification: case-rated thyristors |
BS CECC 90104:1990
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Specification for harmonized system of quality assessment for electronic components. Family specification: C. MOS digital integrated circuits series 4000 B and 4000 UB |
BS CECC 90201:1984
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Specification for harmonized system of quality assessment for electronic components. Blank detail specification: integrated voltage regulators |
BS EN 190116:1994
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Harmonized system of quality assessment for electronic components. Family specification: AC MOS digital integrated circuits |
BS CECC 90301:1985
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Specification for harmonized system of quality assessment for electronic components. Blank detail specification: integrated line transmitters and receivers |
BS CECC 90115:1994
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Specification for harmonized system of quality assessment for electronic components. Blank detail specification: digital gate array integrated circuits |
BS EN 150013:1993
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Specification for harmonized system of quality assessment for electronic components. Blank detail specification: current regulator and current reference diodes |
BS CECC 90113:1987
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Specification for harmonized system of quality assessment for electronic components. Blank detail specification. MOS ultra-violet light erasable electrically programmable read only memories silicon monolithic circuits |
BS EN 120001:1993
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Harmonized system of quality assessment for electronic components. Blank detail specification. Light emitting diodes, light emitting diode arrays, light emitting diode displays without internal logic and resistor |
BS EN 125401:1997
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Harmonized system of quality assessment for electronic components. Blank detail specification. Adjusters used with magnetic oxide (ferrite) cores for use in inductors and tuned transformers |
BS EN 150014:1997
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Harmonized system of quality assessment for electronic components. Blank detail specification: Thyristor diodes, transient overvoltage suppressors |
BS CECC 75301:1992
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Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Interim Example. Detail specification/blank detail specification: rectangular connectors for frequencies below 3 MHz |
BS EN 123000:1992
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Harmonized system of quality assessment for electronic components. Generic specification: printed boards |
BS CECC 90201:1990
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Specification for harmonized system of quality assessment for electronic components. Blank detail specification: integrated voltage regulators |
BS EN 120005:1993
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Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Photodiodes, photodiode-arrays (not intended for fibre optic applications) |
BS CECC 30202:1988
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Specification for harmonized system of quality assessment for electronic components. Blank detail specification: fixed tantalum capacitors with non-solid electrolyte, porous anode (sub-family 2) |
BS EN 111101:1996
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Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Display storage tubes |
BS EN 120002:1993
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Specification for harmonized system of quality assessment for electronic components. Blank detail specification: infrared emitting diodes, infrared emitting diode arrays |
BS CECC 75100:1984
|
Harmonized system of quality assessment for electronic components. Sectional specification: two-part and edge socket connectors for printed board application |
BS CECC 00016:1991
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Harmonized system of quality assessment for electronic components. Basic specification: basic requirements for the use of statistical process control (SPC) in the CECC system |