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  • BS CECC 90000:1985

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    Superseded A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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    Harmonized system of quality assessment for electronic components. Generic specification: monolithic integrated circuits

    Available format(s):  Hardcopy, PDF

    Superseded date:  29-03-1991

    Language(s):  English

    Published date:  29-11-1985

    Publisher:  British Standards Institution

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    Abstract - (Show below) - (Hide below)

    General details, quality assessment procedures, test and measurement procedures and details of screening requirements.

    General Product Information - (Show below) - (Hide below)

    Committee EPL/47
    Development Note Supersedes 81/31418 DC, 86/23012 DC, 86/23480 DC, 87/23549 DC & 90/33497 DC Inactive for the new design. Superseded by BS CECC90000(1991) but remains current for existing approvals. Supersedes BS 9400(1970). (05/2005)
    Document Type Standard
    Publisher British Standards Institution
    Status Superseded
    Superseded By
    Supersedes

    Standards Referenced By This Book - (Show below) - (Hide below)

    EN 190102:1994 Family Specification: TTL-Schottky digital integrated circuits - Series 54S, 64S, 74S, 84S
    BS EN 190102:1994 Specification for harmonized system of quality assessment for electronic components. Family specification: digital integrated TTL-SCHOTTKY circuits, series 54S, 64S, 74S, 84S

    Standards Referencing This Book - (Show below) - (Hide below)

    BS 5555:1993 Specification for SI units and recommendations for the use of their multiples and of certain other units
    IEC 60147-1:1972 Essential ratings and characteristics of semiconductor devices and general principles of measuring methods - Part 1: Essential ratings and characteristics
    IEC 60134:1961 Rating systems for electronic tubes and valves and analogous semiconductor devices
    BS E9007:1975 Specification for harmonized system of quality assessment for electronic components: Basic specification: Sampling plans and procedures for inspection by attributes
    IEC 60027-1:1992 Letters symbols to be used in electrical technology - Part 1: General
    BS 4727(1971) : LATEST
    BS 3934:1965 Specification for dimensions of semiconductor devices and integrated electronic circuits
    BS 2011(1967) : LATEST
    IEC 60191-3:1999 Mechanical standardization of semiconductor devices - Part 3: General rules for the preparation of outline drawings of integrated circuits
    BS 6001(1972) : AMD 5054 SAMPLING PROCEDURES FOR INSPECTION BY ATTRIBUTES - SPECIFICATION FOR SAMPLING PLANS INDEXED BY ACCEPTABLE QUALITY LEVEL (AQL) FOR LOT - BY - LOT INSPECTION
    IEC 60147-2:1963 Essential ratings and characteristics of semiconductor devices and general principles of measuring methods - Part 2: General principles of measuring methods
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