BS CECC 90112:1987
Current
Current
The latest, up-to-date edition.
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. MOS read/write dynamic memories silicon monolithic circuits
Available format(s)
Hardcopy , PDF
Language(s)
English
Published date
15-08-1987
Publisher
Important note : Users cannot be edited or removed once added to your Multi user PDF.Gives ratings, characteristics and inspection requirements which shall be included as mandatory requirements in accordance with BS CECC 90100 in any detail specification for these devices.
| Committee |
EPL/47
|
| DevelopmentNote |
Supersedes 90/20593 DC (01/2006)
|
| DocumentType |
Standard
|
| Pages |
20
|
| PublisherName |
British Standards Institution
|
| Status |
Current
|
| Standards | Relationship |
| CECC 90112 : 86 AMD 1 93 | Identical |
| BS CECC 90100:1983 | Harmonized system of quality assessment for electronic components: sectional specification: digital monolithic integrated circuits |
| BS CECC 90000:1991 | Harmonized system of quality assessment for electronic components. Generic specification: monolithic integrated circuits |
| BS 9000-2(1996) : 1996 | GENERAL REQUIREMENTS FOR A SYSTEM FOR ELECTRONIC COMPONENTS OF ASSESSED QUALITY - SPECIFICATION FOR THE NATIONAL IMPLEMENTATION OF THE CECC SYSTEM |
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