BS EN 120001:1993
Current
Current
The latest, up-to-date edition.
Harmonized system of quality assessment for electronic components. Blank detail specification. Light emitting diodes, light emitting diode arrays, light emitting diode displays without internal logic and resistor
Available format(s)
Hardcopy , PDF
Language(s)
English
Published date
15-11-1991
Publisher
Important note : Users cannot be edited or removed once added to your Multi user PDF.Gives ratings, characteristics and inspection requirements to be included as the minimum mandatory requirements in detail specifications written in accordance with BS CECC 20000.
| Committee |
EPL/100
|
| DevelopmentNote |
Renumbers and supersedes BS CECC20001(1991). 1993 Version incorporates amendment 8000 to BS CECC20001(1991). Supersedes BS CECC20001(1983). (08/2005)
|
| DocumentType |
Standard
|
| Pages |
20
|
| PublisherName |
British Standards Institution
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| EN 120001:1992 | Identical |
| CECC 20001 : 1991 | Identical |
| NEN EN 120001 : 2005 | Identical |
| DIN EN 120001:1993-06 | Identical |
| PD 9004:1989 | BS 9000, CECC & IECQ UK administrative guide |
| BS 9000-2(1996) : 1996 | GENERAL REQUIREMENTS FOR A SYSTEM FOR ELECTRONIC COMPONENTS OF ASSESSED QUALITY - SPECIFICATION FOR THE NATIONAL IMPLEMENTATION OF THE CECC SYSTEM |
| BS 6001-1(1999) : 1999 | SAMPLING PROCEDURES FOR INSPECTION BY ATTRIBUTES - PART 1: SAMPLING SCHEMES INDEXED BY ACCEPTANCE QUALITY LIMIT (AQL) FOR LOT-BY-LOT INSPECTION |
| BS 3934-2(1992) : 1992 AMD 13374 | MECHANICAL STANDARDIZATION OF SEMICONDUCTOR DEVICES - SCHEDULE OF INTERNATIONAL DRAWINGS GIVING DIMENSIONS |
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