BS EN 132100:1997
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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Harmonized system of quality assessment for electronic components. Sectional specification: fixed mulitlayer ceramic surface mounting capacitors. Assessment levels EZ and DZ
Hardcopy , PDF
12-01-2005
English
15-03-1997
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FOREWORD
1 GENERAL
1.1 Scope
1.2 Related documents
1.3 Information to be given in a detail specification
1.4 Terminology
1.5 Marking
2 PREFERRED RATINGS AND CHARACTERISTICS
2.1 Preferred climatic categories
2.2 Preferred values of ratings
3 QUALITY ASSESSMENT PROCEDURES
3.1 Primary stage of manufacture
3.2 Structurally similar components
3.3 Certified test records of released lots
3.4 Qualification approval
3.5 Quality conformance inspection
4 TEST AND MEASUREMENT PROCEDURES
4.1 Special preconditioning
4.2 Preliminary drying
4.3 Measuring conditions
4.4 Mounting
4.5 Visual examination and check of dimensions
4.6 Electrical tests
4.7 Variation of capacitance with temperature
4.8 Shear test
4.9 Substrate bending test
4.10 Resistance to soldering heat
4.11 Solderability
4.12 Rapid change of temperature
4.13 Climatic sequence
4.14 Damp heat, steady state
4.15 Endurance
4.16 Robustness of terminations
4.17 Component solvent resistance
4.18 Solvent resistance of the marking
4.19 Accelerated damp heat, steady state
ANNEX A1 LIST OF TESTS AND SAMPLING PLAN FOR QUALIFICATION
APPROVAL ASSESSMENT LEVEL EZ
ANNEX A2 LIST OF TESTS FOR CONFORMANCE (LOT-BY-LOT)
INSPECTION, ASSESSMENT LEVEL EZ
ANNEX A3 LIST OF TESTS FOR CONFORMANCE (PERIODIC)
INSPECTION, ASSESSMENT LEVEL EZ
ANNEX A4 TEST SCHEDULE FOR QUALIFICATION APPROVAL,
ASSESSMENT LEVEL EZ
ANNEX B CAPACITANCE AGEING OF FIXED CAPACITORS OF
CERAMIC DIELECTRIC CLASS 2
ANNEX C1 LIST OF TESTS AND SAMPLING PLAN FOR
QUALIFICATION APPROVAL, ASSESSEMENT LEVEL DZ
ANNEX C2 LIST OF TESTS FOR CONFORMANCE (LOT-BY-LOT)
INSPECTION, ASSESSMENT LEVEL DZ
ANNEX C3 LIST OF TESTS FOR CONFORMANCE (PERIODIC) -
INSPECTION, ASSESSMENT LEVEL DZ
ANNEX C4 TEST SCHEDULE FOR QUALIFICATION APPROVAL,
ASSESSMENT LEVEL DZ
ANNEX D DESTRUCTIVE PHYSICAL ANALYSIS (DPA)
Applies to fixed unencapsulated multilayer surface mounting capacitors of ceramic dielectric Class 1 & 2 with rated voltage normally not exceeding 200 V.
| Committee |
W/-
|
| DevelopmentNote |
Supersedes 95/213007 DC. (01/2005)
|
| DocumentType |
Standard
|
| Pages |
40
|
| PublisherName |
British Standards Institution
|
| Status |
Superseded
|
| SupersededBy | |
| Supersedes |
| Standards | Relationship |
| SN EN 132100 : 1996 | Identical |
| EN 132100:1996 | Identical |
| I.S. EN 132100:1998 | Identical |
| DIN EN 132100:1997-04 | Identical |
| NEN EN 132100 : 1996 | Identical |
| BS EN 132101:1997 | Blank detail specification. Fixed multilayer ceramic surface mounting capacitors. Assessment level EZ |
| BS EN 132102:1997 | Blank detail specification. Fixed multilayer ceramic surface mounting capacitors. Assessment level DZ |
| BS EN 100014:1992 | Harmonized system of quality assessment for electronic components. Basic specification: CECC assessed process average procedure (60% confidence limit) |
| IEC 60384-10:1989 | Fixed capacitors for use in electronic equipment. Part 10: Sectional specification: Fixed multilayer ceramic chip capacitors |
| ISO 3:1973 | Preferred numbers Series of preferred numbers |
| EN 130000 : 93 AMD 10 | FIXED CAPACITORS |
| IEC 60410:1973 | Sampling plans and procedures for inspection by attributes |
| IEC 60062:2016 | Marking codes for resistors and capacitors |
| IEC 60063:2015 | Preferred number series for resistors and capacitors |
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