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BS EN 60068-2-30:1999

Superseded

Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

View Superseded by

Environmental testing. Test methods Test Db and guidance: damp heat, cyclic (12 + 12 hour cycle)

Available format(s)

Hardcopy , PDF

Superseded date

09-11-2022

Superseded by

BS EN 60068-2-30:2005

Language(s)

English

Published date

15-09-1999

Committee
GEL/104
DocumentType
Standard
Pages
16
PublisherName
British Standards Institution
Status
Superseded
SupersededBy
Supersedes

Provides a test procedure for determining the ability of semiconductor devices and components and/or board assemblies to withstand mechanical stresses induced by alternating high and low temperature extremes. Permanent changes in electrical and/or physical characteristics can result from these mechanical stresses. Applies to single, dual and triple chamber temperature cycling and covers component and solder interconnection testing.

Standards Relationship
IEC 60749-25:2003 Identical
EN 60068-2-30:1999 Identical

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