BS EN 60068-2-30:1999
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
View Superseded by
Environmental testing. Test methods Test Db and guidance: damp heat, cyclic (12 + 12 hour cycle)
Hardcopy , PDF
09-11-2022
English
15-09-1999
Committee |
GEL/104
|
DocumentType |
Standard
|
Pages |
16
|
PublisherName |
British Standards Institution
|
Status |
Superseded
|
SupersededBy | |
Supersedes |
Provides a test procedure for determining the ability of semiconductor devices and components and/or board assemblies to withstand mechanical stresses induced by alternating high and low temperature extremes. Permanent changes in electrical and/or physical characteristics can result from these mechanical stresses. Applies to single, dual and triple chamber temperature cycling and covers component and solder interconnection testing.
Standards | Relationship |
IEC 60749-25:2003 | Identical |
EN 60068-2-30:1999 | Identical |
Access your standards online with a subscription
Features
-
Simple online access to standards, technical information and regulations.
-
Critical updates of standards and customisable alerts and notifications.
-
Multi-user online standards collection: secure, flexible and cost effective.