BS EN 60444-11:2010
Current
The latest, up-to-date edition.
Measurement of quartz crystal unit parameters Standard method for the determination of the load resonance frequency ƒL and the effective load capacitance CLeff using automatic network analyzer techniques and error correction
Hardcopy , PDF
English
31-12-2010
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1 Scope
2 Normative references
3 General concepts
4 Reference plane and test conditions
Bibliography
Annex ZA (normative) - Normative references to international
publications with their corresponding European
publications
Specifies the standard method of measuring load resonance frequency f[L] at the nominal value of C[L], and the determination of the effective load capacitance C[Leff] at the nominal frequency for crystals with the figure of merit M > 4.
| Committee |
W/-
|
| DevelopmentNote |
Supersedes 08/30180527 DC. (12/2010)
|
| DocumentType |
Standard
|
| Pages |
18
|
| PublisherName |
British Standards Institution
|
| Status |
Current
|
| Supersedes |
This part of IEC 60444 defines the standard method of measuring load resonance frequency fL at the nominal value of CL, and the determination of the effective load capacitance CLeff at the nominal frequency for crystals with the figure of merit M > 4.
M, according to Table 1 of IEC 60122-1:2002, is expressed in the following equation:
This gives good results in a frequency range up to 200 MHz. This method allows the calculation of load resonance frequency offset ΔfL, frequency pulling range ΔfL1,L2 and pulling sensitivity S as described in 2.2.31 of IEC 60122-1:2002. In contrary to the simple method of IEC 60444-4, this measurement technique avoids the use of physical load capacitors, and allows higher accuracy, better reproducibility and correlation to the application. It extends the upper frequency limit from 30MHz by the method of IEC 60444-4 to 200MHz approximately. This method is based on the error-corrected measurement technique of IEC 60444-5:1995, and therefore allows the measurement of fL and CLeff together with the determination of the equivalent crystal parameters in one sequence without changing the test fixture.
With this method the frequency fL is searched where the reactance XC of the crystal has the opposite value of the reactance of the load capacitance.
Furthermore this method allows to determine the effective load capacitance CLeff at the nominal frequency fnom.
| Standards | Relationship |
| IEC 60444-11:2010 | Identical |
| EN 60444-11:2010 | Identical |
| EN 60444-4:1997 | Measurement of quartz crystal unit parameters by zero phase technique in a pi-network - Part 4: Method for the measurement of the load resonance frequency fL, load resonance resistance RL and the calculation of other derived values of quartz crystal units, up to 30 MHz |
| IEC 60444-5:1995 | Measurement of quartz crystal units parameters - Part 5: Methods for the determination of equivalent electrical parameters using automatic network analyzer techniques and error correction |
| IEC TR 60444-4:1988 | Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 4: Method for the measurement of the load resonance frequency fL, load resonance resistance RL and the calculation of other derived values of quartz crystal units, up to 30 MHz |
| IEC 60122-1:2002 | Quartz crystal units of assessed quality - Part 1: Generic specification |
| EN 60444-5:1997 | Measurement of quartz crystal unit parameters - Part 5: Methods for the determination of equivalent electrical parameters using automatic network analyzer techniques and error correction |
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