• EN 60444-5:1997

    Current The latest, up-to-date edition.

    Measurement of quartz crystal unit parameters - Part 5: Methods for the determination of equivalent electrical parameters using automatic network analyzer techniques and error correction

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    Published date:  17-04-1997

    Publisher:  European Committee for Standards - Electrical

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    Table of Contents - (Show below) - (Hide below)

    Committees responsible
    National foreword
    Methods
    1 Scope
    2 Introduction
    3 Measurement procedures
    4 Choice of admittance measurement method
    5 Calibration techniques
    6 Low-frequency measurements
    7 Admittance analysis and estimation of the equivalent
        circuit parameters
    8 Measurement errors, instrumentation and test fixtures
    Annexes
    A (normative) Calibration
    B (informative) Low-frequency measurement
    C (informative) Bibliography
    Figures
    1 Measurement sequence
    2 Measurement methods, admittance analysis and parameter
        estimation techniques
    3 One-port equivalent circuit of a single-mode quartz
        crystal unit
    4 Two-port equivalent circuit of a single-mode quartz
        crystal unit
    5 Admittance and impedance circle of a quartz crystal
        unit for frequencies near an isolated mode of vibration
    6 General one-port equivalent circuit for multiple
        resonance
    7 Two-port equivalent circuit for multiple resonances
    8 Procedure for the determination of the equivalent
        circuit parameters of a quartz crystal unit
    9 Calibration verification for S-parameter measurement
    10 APC-3.5 Transmission fixture
    11 APC-7 Transmission fixture
    12 APC-7 Reflection fixture
    13 APC-3.5 One-port fixture
    14 APC 3.5 Two-port fixture
    15 Direct transmission measurement fixture
        A.1 Simplified one-port network analyzer
        A.2 Simplified two-port, three-channel network analyzer
        A.3 Signal flowgraph representation for proposed
              12-term error model
        A.4 Typical direct transmission system
        A.5 Equivalent circuit for direct transmission method
        A.6 Thin-film calibration resistor
        A.7 Modified SMA terminating resistor
        B.1 Simplified network analyzer test system for
              low-frequency measurements
        B.2 1 : 2 Directional bridge for low-frequency
              measurements
        B.3 1 : 1 Directional bridge for low-frequency
              measurements
    Annex ZA (normative) Normative references to international
    publications with their corresponding European publications

    Abstract - (Show below) - (Hide below)

    Gives methods for determining the best representations of modes in quartz crystal resonators by linear equivalent circuits.

    General Product Information - (Show below) - (Hide below)

    Committee CLC/SR 49
    Document Type Standard
    Publisher European Committee for Standards - Electrical
    Status Current

    Standards Referenced By This Book - (Show below) - (Hide below)

    CEI EN 60444-8 : 2004 MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS - PART 8: TEST FIXTURE FOR SURFACE MOUNTED QUARTZ CRYSTAL UNITS
    I.S. EN 60444-8:2017 MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS - PART 8: TEST FIXTURE FOR SURFACE MOUNTED QUARTZ CRYSTAL UNITS
    EN 60444-8:2017 Measurement of quartz crystal unit parameters - Part 8 : Test fixture for surface mounted quartz crystal units
    I.S. EN 60444-6:2013 MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS - PART 6: MEASUREMENT OF DRIVE LEVEL DEPENDENCE (DLD) (IEC 60444-6:2013 (EQV))
    EN 60444-6:2013 Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)
    BS EN 60444-6:2013 Measurement of quartz crystal unit parameters Measurement of drive level dependence (DLD)
    CEI EN 60122-1 : 2004 QUARTZ CRYSTAL UNITS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION
    EN 60444-11:2010 Measurement of quartz crystal unit parameters - Part 11: Standard method for the determination of the load resonance frequency fL and the effective load capacitance CLeff using automatic network analyzer techniques and error correction
    BS EN 60444-11:2010 Measurement of quartz crystal unit parameters Standard method for the determination of the load resonance frequency ƒL and the effective load capacitance CLeff using automatic network analyzer techniques and error correction
    BS EN 60444-8:2017 Measurement of quartz crystal unit parameters Test fixture for surface mounted quartz crystal units
    CEI EN 60444-11 : 2011 MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS - PART 11: STANDARD METHOD FOR THE DETERMINATION OF THE LOAD RESONANCE FREQUENCY F[L] AND THE EFFECTIVE LOAD CAPACITANCE C[LEFF] USING AUTOMATIC NETWORK ANALYZER TECHNIQUES AND ERROR CORRECTION
    BS EN 60122-1 : 2002 QUARTZ CRYSTAL UNITS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION
    I.S. EN 60122-1:2002 AMD 1 2018 QUARTZ CRYSTAL UNITS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION
    CEI EN 60444-6 : 2014 MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS - PART 6: MEASUREMENT OF DRIVE LEVEL DEPENDENCE (DLD)
    I.S. EN 60444-11:2010 MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS - PART 11: STANDARD METHOD FOR THE DETERMINATION OF THE LOAD RESONANCE FREQUENCY F[L] AND THE EFFECTIVE LOAD CAPACITANCE C[LEFF] USING AUTOMATIC NETWORK ANALYZER TECHNIQUES AND ERROR CORRECTION
    EN 60122-1:2002/A1:2018 QUARTZ CRYSTAL UNITS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION (IEC 60122-1:2002/A1:2017)

    Standards Referencing This Book - (Show below) - (Hide below)

    IEC 61080:1991 Guide to the measurement of equivalent electrical parameters of quartz crystal units
    IEC 60302:1969 Standard definitions and methods of measurement for piezoelectric vibrators operating over the frequency range up to 30 MHz
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