• EN 60444-5:1997

    Current The latest, up-to-date edition.

    Measurement of quartz crystal unit parameters - Part 5: Methods for the determination of equivalent electrical parameters using automatic network analyzer techniques and error correction

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    Published date:  17-04-1997

    Publisher:  European Committee for Standards - Electrical

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    Table of Contents - (Show below) - (Hide below)

    Committees responsible
    National foreword
    Methods
    1 Scope
    2 Introduction
    3 Measurement procedures
    4 Choice of admittance measurement method
    5 Calibration techniques
    6 Low-frequency measurements
    7 Admittance analysis and estimation of the equivalent
        circuit parameters
    8 Measurement errors, instrumentation and test fixtures
    Annexes
    A (normative) Calibration
    B (informative) Low-frequency measurement
    C (informative) Bibliography
    Figures
    1 Measurement sequence
    2 Measurement methods, admittance analysis and parameter
        estimation techniques
    3 One-port equivalent circuit of a single-mode quartz
        crystal unit
    4 Two-port equivalent circuit of a single-mode quartz
        crystal unit
    5 Admittance and impedance circle of a quartz crystal
        unit for frequencies near an isolated mode of vibration
    6 General one-port equivalent circuit for multiple
        resonance
    7 Two-port equivalent circuit for multiple resonances
    8 Procedure for the determination of the equivalent
        circuit parameters of a quartz crystal unit
    9 Calibration verification for S-parameter measurement
    10 APC-3.5 Transmission fixture
    11 APC-7 Transmission fixture
    12 APC-7 Reflection fixture
    13 APC-3.5 One-port fixture
    14 APC 3.5 Two-port fixture
    15 Direct transmission measurement fixture
        A.1 Simplified one-port network analyzer
        A.2 Simplified two-port, three-channel network analyzer
        A.3 Signal flowgraph representation for proposed
              12-term error model
        A.4 Typical direct transmission system
        A.5 Equivalent circuit for direct transmission method
        A.6 Thin-film calibration resistor
        A.7 Modified SMA terminating resistor
        B.1 Simplified network analyzer test system for
              low-frequency measurements
        B.2 1 : 2 Directional bridge for low-frequency
              measurements
        B.3 1 : 1 Directional bridge for low-frequency
              measurements
    Annex ZA (normative) Normative references to international
    publications with their corresponding European publications

    Abstract - (Show below) - (Hide below)

    Gives methods for determining the best representations of modes in quartz crystal resonators by linear equivalent circuits.

    General Product Information - (Show below) - (Hide below)

    Committee CLC/SR 49
    Document Type Standard
    Publisher European Committee for Standards - Electrical
    Status Current

    Standards Referenced By This Book - (Show below) - (Hide below)

    CEI EN 60444-8 : 2004 MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS - PART 8: TEST FIXTURE FOR SURFACE MOUNTED QUARTZ CRYSTAL UNITS
    I.S. EN 60444-8:2017 MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS - PART 8: TEST FIXTURE FOR SURFACE MOUNTED QUARTZ CRYSTAL UNITS
    EN 60444-8:2017 Measurement of quartz crystal unit parameters - Part 8 : Test fixture for surface mounted quartz crystal units
    I.S. EN 60444-6:2013 MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS - PART 6: MEASUREMENT OF DRIVE LEVEL DEPENDENCE (DLD) (IEC 60444-6:2013 (EQV))
    EN 60444-6:2013 Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)
    BS EN 60444-6:2013 (published 2013-10) Measurement of quartz crystal unit parameters Measurement of drive level dependence (DLD)
    CEI EN 60122-1 : 2004 QUARTZ CRYSTAL UNITS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION
    EN 60444-11:2010 Measurement of quartz crystal unit parameters - Part 11: Standard method for the determination of the load resonance frequency fL and the effective load capacitance CLeff using automatic network analyzer techniques and error correction
    BS EN 60444-11:2010 Measurement of quartz crystal unit parameters Standard method for the determination of the load resonance frequency L and the effective load capacitance CLeff using automatic network analyzer techniques and error correction
    BS EN 60444-8:2017 Measurement of quartz crystal unit parameters Test fixture for surface mounted quartz crystal units
    CEI EN 60444-11 : 2011 MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS - PART 11: STANDARD METHOD FOR THE DETERMINATION OF THE LOAD RESONANCE FREQUENCY F[L] AND THE EFFECTIVE LOAD CAPACITANCE C[LEFF] USING AUTOMATIC NETWORK ANALYZER TECHNIQUES AND ERROR CORRECTION
    BS EN 60122-1 : 2002 QUARTZ CRYSTAL UNITS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION
    I.S. EN 60122-1:2002 AMD 1 2018 QUARTZ CRYSTAL UNITS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION
    CEI EN 60444-6 : 2014 MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS - PART 6: MEASUREMENT OF DRIVE LEVEL DEPENDENCE (DLD)
    I.S. EN 60444-11:2010 MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS - PART 11: STANDARD METHOD FOR THE DETERMINATION OF THE LOAD RESONANCE FREQUENCY F[L] AND THE EFFECTIVE LOAD CAPACITANCE C[LEFF] USING AUTOMATIC NETWORK ANALYZER TECHNIQUES AND ERROR CORRECTION
    EN 60122-1:2002/A1:2018 QUARTZ CRYSTAL UNITS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION (IEC 60122-1:2002/A1:2017)

    Standards Referencing This Book - (Show below) - (Hide below)

    IEC 61080:1991 Guide to the measurement of equivalent electrical parameters of quartz crystal units
    IEC 60302:1969 Standard definitions and methods of measurement for piezoelectric vibrators operating over the frequency range up to 30 MHz
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