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  • BS EN 60749-1:2003

    Current The latest, up-to-date edition.

    Semiconductor devices. Mechanical and climatic test methods General

    Available format(s):  Hardcopy, PDF

    Language(s):  English

    Published date:  07-07-2003

    Publisher:  British Standards Institution

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    Table of Contents - (Show below) - (Hide below)

    INTRODUCTION
    1 Scope
    2 Normative references
    3 Terms, definitions and letter symbols
    4 Standard atmospheric conditions
    5 Electrical measurements
    6 Use of electrically defective devices
    Annex ZA (normative) Normative references to international
             publications with their corresponding European
             publications

    Abstract - (Show below) - (Hide below)

    Applies to semiconductor devices (discrete devices and integrated circuits) and establishes provisions common to all the other parts of the series.

    Scope - (Show below) - (Hide below)

    Applicable to semiconductor devices (discrete devices and integrated circuits) and establishes provisions common to all the other parts of the series. The contents of the corrigendum of August 2003 have been included in this copy.

    General Product Information - (Show below) - (Hide below)

    Committee EPL/47
    Development Note Supersedes 01/203181 DC (07/2003) Supersedes BS EN 60749. (09/2005)
    Document Type Standard
    Publisher British Standards Institution
    Status Current
    Supersedes
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