BS EN 61189-3-719:2016
Current
The latest, up-to-date edition.
Test methods for electrical materials, printed boards and other interconnection structures and assemblies Test methods for interconnection structures (printed boards). Monitoring of single plated-through hole (PTH) resistance change during temperature cycling
Hardcopy , PDF
English
30-04-2016
FOREWORD
1 Scope
2 Normative references
3 Terms and definitions
4 Test specimens
5 Test apparatus
6 Procedure
7 Report
8 Additional information
Bibliography
Annex ZA (normative) - Normative references to
international publications with their
corresponding European publications
Defines a test method to monitor the resistance of single plated-through holes (PTHs) in printed circuit boards (PCBs) to determine the PTH durability under thermo-mechanical stress induced by temperature cycling.
Committee |
EPL/501
|
DevelopmentNote |
Supersedes 13/30293995 DC. (04/2016)
|
DocumentType |
Standard
|
Pages |
18
|
PublisherName |
British Standards Institution
|
Status |
Current
|
Supersedes |
This part of IEC61189 specifies a test method to monitor the resistance of single plated-through holes (PTHs) in printed circuit boards (PCBs) to determine the PTH durability under thermo-mechanical stress induced by temperature cycling.
Standards | Relationship |
EN 61189-3-719:2016 | Identical |
IEC 61189-3-719:2016 | Identical |
IEC 60068-2-58:2015+AMD1:2017 CSV | Environmental testing - Part 2-58: Tests - Test Td: Test methods for solderability, resistance to dissolution of metallization and to soldering heat of surface mounting devices (SMD) |
IPC 2221B:2012 | GENERIC STANDARD ON PRINTED BOARD DESIGN |
IEC 60194:2015 | Printed board design, manufacture and assembly - Terms and definitions |
IEC 60068-2-14:2009 | Environmental testing - Part 2-14: Tests - Test N: Change of temperature |
EN 60068-2-14:2009 | Environmental testing - Part 2-14: Tests - Test N: Change of temperature |
EN 60194:2006 | Printed board design, manufacture and assembly - Terms and definitions |
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