BS EN 61338-1-5:2015

FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Measurement and related parameters
4 Calculation equations for R[i] and sigma[i]
5 Preparation of specimen
6 Measurement equipment and apparatus
7 Measurement procedure
8 Example of measurement result
Annex A (informative) - Derivation of Equation (4) for Ri
Annex B (informative) - Calculation uncertainty of
        parameters in Figure 3
Bibliography
Annex ZA (normative) - Normative references to
         international publications with their
         corresponding European publications

Explains a measurement method for resistance and effective conductivity at the interface between conductor layer and dielectric substrate, which are called interface resistance and interface conductivity.

IEC 61338-1-5:2015 describes a measurement method for resistance and effective conductivity at the interface between conductor layer and dielectric substrate, which are called interface resistance and interface conductivity. This first edition cancels and replaces IEC PAS 61338-1-5 published in 2010. This edition includes the following significant technical changes with respect to the previous edition:
a) description of technical content related to patents (Japanese patent numbers JP3634966, JP3735501) in the Introduction;
b) changes to normative references;
c)addition to bibliography.