I.S. EN 61338-1-5:2015
Current
The latest, up-to-date edition.
WAVEGUIDE TYPE DIELECTRIC RESONATORS - PART 1-5: GENERAL INFORMATION AND TEST CONDITIONS - MEASUREMENT METHOD OF CONDUCTIVITY AT INTERFACE BETWEEN CONDUCTOR LAYER AND DIELECTRIC SUBSTRATE AT MICROWAVE FREQUENCY
Hardcopy , PDF
English
01-01-2015
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National Foreword
FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Measurement and related parameters
4 Calculation equations for R[i] and sigma[i]
5 Preparation of specimen
6 Measurement equipment and apparatus
7 Measurement procedure
8 Example of measurement result
Annex A (informative) - Derivation of Equation (4) for Ri
Annex B (informative) - Calculation uncertainty of
parameters in Figure 3
Bibliography
Annex ZA (normative) - Normative references to
international publications with their
corresponding European publications
Explains a measurement method for resistance and effective conductivity at the interface between conductor layer and dielectric substrate, which are called interface resistance and interface conductivity.
| DevelopmentNote |
For CENELEC adoptions of IEC publications, please check www.iec.ch to be sure that you have any corrigenda that may apply. (01/2017)
|
| DocumentType |
Standard
|
| Pages |
54
|
| PublisherName |
National Standards Authority of Ireland
|
| Status |
Current
|
| Standards | Relationship |
| EN 61338-1-5:2015 | Identical |
| BS EN 61338-1-5:2015 | Equivalent |
| IEC 61338-1-5:2015 | Equivalent |
| UNE-EN 61338-1-5:2015 | Equivalent |
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