• BS EN 61340-3-2:2007

    Current The latest, up-to-date edition.

    Electrostatics Methods for simulation of electrostatic effects. Machine model (MM) electrostatic discharge test waveforms

    Available format(s):  Hardcopy, PDF

    Language(s):  English

    Published date:  30-04-2007

    Publisher:  British Standards Institution

    Add To Cart

    Table of Contents - (Show below) - (Hide below)

    Foreword
    1 Scope
    2 Terms and definitions
    3 Equipment
    4 MM current waveform requirements
    5 Evaluation of ESD robustness of the UUT
    6 Test procedure
    7 Failure criteria
    8 MM ESD withstand classification
    Bibliography

    Abstract - (Show below) - (Hide below)

    Describes the discharge current waveforms used to simulate machine model (MM) electrostatic discharges (ESD) and the basic requirements for equipment used to develop and verify these waveforms.

    Scope - (Show below) - (Hide below)

    Describes the discharge current waveforms used to simulate machine model (MM) electrostatic discharges (ESD) and the basic requirements for equipment used to develop and verify these waveforms. This standard covers MM ESD waveforms for use in general test methods and for application to materials or objects, electronic components and other items for ESD withstand test or performance evaluation purposes. The specific application of these MM ESD waveforms to non-powered semiconductor devices is covered in IEC 60749-27. The major change of this document is that it no longer contains the application to semiconductor devices.

    General Product Information - (Show below) - (Hide below)

    Committee GEL/101
    Development Note Supersedes 98/261861 DC (07/2002) Supersedes 05/30127809 DC. (04/2007)
    Document Type Standard
    Publisher British Standards Institution
    Status Current
    Supersedes

    Standards Referencing This Book - (Show below) - (Hide below)

    IEC 60749-27:2006+AMD1:2012 CSV Semiconductor devices - Mechanical and climatic test methods - Part27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
    EN 60749-27:2006/A1:2012 SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 27: ELECTROSTATIC DISCHARGE (ESD) SENSITIVITY TESTING - MACHINE MODEL (MM)
    • Access your standards online with a subscription

      Features

      • Simple online access to standards, technical information and regulations
      • Critical updates of standards and customisable alerts and notifications
      • Multi - user online standards collection: secure, flexibile and cost effective