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  • IEC 61340-3-2:2006

    Withdrawn A Withdrawn Standard is one, which is removed from sale, and its unique number can no longer be used. The Standard can be withdrawn and not replaced, or it can be withdrawn and replaced by a Standard with a different number.

    Electrostatics - Part 3-2: Methods for simulation of electrostatic effects - Machine model (MM) electrostatic discharge test waveforms

    Available format(s):  Hardcopy, PDF, PDF 3 Users, PDF 5 Users, PDF 9 Users

    Withdrawn date:  12-09-2022

    Language(s):  English - French, Spanish, Castilian

    Published date:  13-12-2006

    Publisher:  International Electrotechnical Committee

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    Table of Contents - (Show below) - (Hide below)

    FOREWORD
    1 Scope
    2 Terms and definitions
    3 Equipment
    4 MM current waveform requirements
    5 Evaluation of ESD robustness of the UUT
    6 Test procedure
    7 Failure criteria
    8 MM ESD withstand classification
    Bibliography

    Abstract - (Show below) - (Hide below)

    Describes the discharge current waveforms used to simulate machine model (MM) electrostatic discharges (ESD) and the basic requirements for equipment used to develop and verify these waveforms. This standard covers MM ESD waveforms for use in general test methods and for application to materials or objects, electronic components and other items for ESD withstand test or performance evaluation purposes. The specific application of these MM ESD waveforms to non-powered semiconductor devices is covered in IEC 60749-27. The major change of this document is that it no longer contains the application to semiconductor devices.

    General Product Information - (Show below) - (Hide below)

    Development Note Stability Date: 2020. (09/2017)
    Document Type Standard
    Publisher International Electrotechnical Committee
    Status Withdrawn
    Supersedes

    Standards Referenced By This Book - (Show below) - (Hide below)

    12/30258507 DC : 0 BS EN 62575-1 - RADIO FREQUENCY (RF) BUK ACOUSTIC WAVE (BAW) FILTERS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION
    BS EN 62575-1:2016 Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality Generic specification
    BS EN 60749-27 : 2006 SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 27: ELECTROSTATIC DISCHARGE (ESD) SENSITIVITY TESTING - MACHINE MODEL (MM)
    I.S. EN 62575-1:2016 RADIO FREQUENCY (RF) BULK ACOUSTIC WAVE (BAW) FILTERS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION
    IEC 60749-27:2006+AMD1:2012 CSV Semiconductor devices - Mechanical and climatic test methods - Part27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
    EN 62604-1:2015 Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 1: Generic specification
    BS EN 60862-1:2015 Surface acoustic wave (SAW) filters of assessed quality Generic specification
    12/30252220 DC : DRAFT MAR 2012 BS EN 62604-1 - SURFACE ACOUSTIC WAVE (SAW) AND BULK ACOUSTIC WAVE (BAW) DUPLEXERS - PART 1: GENERIC SPECIFICATION
    IEC TR 61340-1:2012 Electrostatics - Part 1: Electrostatic phenomena - Principles and measurements
    I.S. EN 60749-27:2006 SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 27: ELECTROSTATIC DISCHARGE (ESD) SENSITIVITY TESTING - MACHINE MODEL (MM) (IEC 60749-27:2006 (EQV))
    IEC 62575-1:2015 Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality - Part 1: Generic specification
    BS EN 62604-1:2015 Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality Generic specification
    IEC 62604-1:2015 Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 1: Generic specification
    IEC 60862-1:2015 Surface acoustic wave (SAW) filters of assessed quality - Part 1: Generic specification
    EN 60862-1:2015 Surface acoustic wave (SAW) filters of assessed quality - Part 1: Generic specification
    05/30128292 DC : DRAFT JAN 2005 IEC 60749-27 ED.2 - SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 27: ELECTROSTATIC DISCHARGE (ESD) SENSITIVITY TESTING MACHINE MODEL (MM)
    I.S. EN 62604-1:2015 SURFACE ACOUSTIC WAVE (SAW) AND BULK ACOUSTIC WAVE (BAW) DUPLEXERS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION
    I.S. EN 60862-1:2015 SURFACE ACOUSTIC WAVE (SAW) FILTERS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION
    EN 60749-27:2006/A1:2012 SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 27: ELECTROSTATIC DISCHARGE (ESD) SENSITIVITY TESTING - MACHINE MODEL (MM)
    EN 62575-1:2016 Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality - Part 1: Generic specification

    Standards Referencing This Book - (Show below) - (Hide below)

    IEC 60749-27:2006+AMD1:2012 CSV Semiconductor devices - Mechanical and climatic test methods - Part27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
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