• BS EN 61747-5 : 1998

    Current The latest, up-to-date edition.

    LIQUID CRYSTAL AND SOLID-STATE DISPLAY DEVICES - PART 5: ENVIRONMENTAL, ENDURANCE AND MECHANICAL TEST METHODS

    Available format(s):  Hardcopy, PDF

    Language(s):  English

    Published date:  01-01-1998

    Publisher:  British Standards Institution

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    Table of Contents - (Show below) - (Hide below)

    1 General
        1.1 Scope and object
        1.2 Normative references
        1.3 Terms, definitions and letter symbols
        1.4 Standard atmospheric conditions
        1.5 Visual examination and verification of dimensions
        1.6 Electrical and optical measurement
        1.7 Electrical operating conditions
    2 Mechanical test methods
        2.1 Robustness of terminations
        2.2 Soldering
        2.3 Vibration (sinusoidal)
        2.4 Shock
        2.5 Acceleration, steady state
        2.6 Bond strength test
    3 Environmental and endurance test methods
        3.1 Change of temperature
        3.2 Storage (at high temperature)
        3.3 Storage (at low temperature)
        3.4 Low air pressure
        3.5 Damp heat, steady state
        3.6 Damp heat, cyclic (12 + 12-hour cycle)
        3.7 Composite temperature/humidity cyclic test
        3.8 Light exposure
        3.9 ESD Test
    4 Miscellaneous test methods
        4.1 Permanence of marking
        4.2 Scratch test (of face plate)
        4.3 Life test
    5 Visual inspection of monochrome matrix liquid crystal
        display modules (Excluding all active matrix liquid
        crystal display modules)
        5.1 General
        5.2 Visual inspection of displays
    6 Visual inspection of monochrome liquid crystal display
        cells (excluding all active matrix liquid crystal
        display modules)
        6.1 General
        6.2 Visual inspection of displays
        6.3 Seal inspections (see figure 13)
        6.4 Visual inspection of contact pad area (see figure
              14)
        6.5 Visual inspection for chipped material at the
              borders and edges of the support plates of cells
    Annex A Cross references index
    Annex ZA Normative references to international publications
              with their corresponding European publications

    Abstract - (Show below) - (Hide below)

    Gives test procedures which apply to liquid crystal display devices. Allows wherever possible, for the environmental test procedures in IEC 60068.

    General Product Information - (Show below) - (Hide below)

    Committee EPL/47/3
    Development Note Supersedes 93/203879 DC. Also numbered as IEC 61747-5. (09/2005)
    Document Type Standard
    Publisher British Standards Institution
    Status Current
    Superseded By

    Standards Referencing This Book - (Show below) - (Hide below)

    HD 323.2.5 : 200S1 BASIC ENVIRONMENTAL TESTING PROCEDURES - TESTS - TEST SA - SIMULATED SOLAR RADIATION AT GROUND LEVEL
    IEC 60068-2-5:2010 Environmental testing - Part 2-5: Tests - Test Sa: Simulated solar radiation at ground level and guidance for solar radiation testing
    HD 323.2.20 : 200S3 BASIC ENVIRONMENTAL TESTING PROCEDURES - TESTS - TEST T - SOLDERING
    IEC 60068-1:2013 Environmental testing - Part 1: General and guidance
    IEC 60068-2-27:2008 Environmental testing - Part 2-27: Tests - Test Ea and guidance: Shock
    HD 323.2.13 : 200S1 BASIC ENVIRONMENTAL TESTING PROCEDURES - TESTS - TEST M: LOW AIR PRESSURE
    IEC 60068-2-20:2008 Environmental testing - Part 2-20: Tests - Test T: Test methods for solderability and resistance to soldering heat of devices with leads
    EN 60068-2-1:2007 ENVIRONMENTAL TESTING - PART 2-1: TESTS - TEST A: COLD
    EN 60068-2-2:2007 ENVIRONMENTAL TESTING - PART 2-2: TESTS - TEST B: DRY HEAT
    IEC 60068-2-21:2006 Environmental testing - Part 2-21: Tests - Test U: Robustness of terminations and integral mounting devices
    IEC 60068-2-13:1983 ENVIRONMENTAL TESTING - PART 2: TESTS - TEST M: LOW AIR PRESSURE
    EN 60068-1:2014 ENVIRONMENTAL TESTING - PART 1: GENERAL AND GUIDANCE (IEC 60068-1:2013)
    HD 323.2.14 : 200S2 BASIC ENVIRONMENTAL TESTING PROCEDURES - TESTS - TEST N: OF TEMPERATURE
    EN 60068-2-7 : 1993 ENVIRONMENTAL TESTING - TESTS - TEST GA AND GUIDANCE: ACCELERATION, STEADY STATE
    IEC 60747-5:1992 Semiconductor devices - Discrete devices and integrated circuits -Part 5: Optoelectronic devices
    HD 323.2.30 : 200S3 BASIC ENVIRONMENTAL TESTING PROCEDURES - PART 2: TESTS - TEST DB AND GUIDANCE: DAMP HEAT, CYCLIC (12 + 12-HOUR CYCLE)
    EN 60068-2-27:2009 ENVIRONMENTAL TESTING - PART 2-27: TESTS - TEST EA AND GUIDANCE: SHOCK
    HD 323.2.3 : 200S2 BASIC ENVIRONMENTAL TESTING PROCEDURES - TESTS - TEST CA - DAMP HEAT, STEADY STATE
    IEC 60068-2-3:1969 ENVIRONMENTAL TESTING - TEST CA: DAMP HEAT, STEADY STATE
    EN 60068-2-21:2006 ENVIRONMENTAL TESTING - PART 2-21: TESTS - TEST U: ROBUSTNESS OF TERMINATIONS AND INTEGRAL MOUNTING DEVICES
    IEC 60068-2-2:2007 Environmental testing - Part 2-2: Tests - Test B: Dry heat
    IEC 60747-1:2006+AMD1:2010 CSV Semiconductor devices - Part 1: General
    IEC 60749:1996+AMD1:2000+AMD2:2001 CSV SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS
    EN 60068-2-6:2008 ENVIRONMENTAL TESTING - PART 2-6: TESTS - TEST FC: VIBRATION (SINUSOIDAL)
    IEC 60748-1:2002 Semiconductor devices - Integrated circuits - Part 1: General
    IEC 60068-2-1:2007 Environmental testing - Part 2-1: Tests - Test A: Cold
    IEC 60068-2-14:2009 Environmental testing - Part 2-14: Tests - Test N: Change of temperature
    EN 60068-2-45:1992/A1:1993 Environmental testing - Part 2: Tests - Test Xa and guidance: Immersion in cleaning solvents
    HD 323.2.38 : 200S1 BASIC ENVIRONMENTAL TESTING PROCEDURES - TESTS - TESTS Z/AD: COMPOSITE TEMPERATURE/HUMIDITY CYCLIC TEST
    IEC 60068-2-30:2005 Environmental testing - Part 2-30: Tests - Test Db: Damp heat, cyclic (12 h + 12 h cycle)
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