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  • EN 61747-5:1998

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    Superseded A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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    Liquid crystal and solid-state display devices - Part 5: Environmental, endurance and mechanical test methods

    Available format(s): 

    Superseded date:  09-02-2022

    Language(s): 

    Published date:  07-09-1998

    Publisher:  European Committee for Standards - Electrical

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    Table of Contents - (Show below) - (Hide below)

    FOREWORD
    1 General
      1.1 Scope and object
      1.2 Normative references
      1.3 Terms, definitions and letter symbols
      1.4 Standard atmospheric conditions
      1.5 Visual examination and verification of dimensions
      1.6 Electrical and optical measurements
      1.7 Electrical operating conditions
    2 Mechanical test methods
      2.1 Robustness of terminations
      2.2 Soldering
      2.3 Vibration (sinusoidal)
      2.4 Shock
      2.5 Acceleration, steady state
      2.6 Bond strength test
    3 Environmental and endurance test methods
      3.1 Change of temperature
      3.2 Storage (at high temperature)
      3.3 Storage (at low temperature)
      3.4 Low air pressure
      3.5 Damp heat, steady state
      3.6 Damp heat, cyclic (12+12-hour cycle)
      3.7 Composite temperature/humidity cyclic test support
      3.8 Light exposure
      3.9 ESD Test
    4 Miscellaneous test methods
      4.1 Permanence of marking
      4.2 Scratch test (of face plate)
      4.3 Life test
    5 Visual inspection of monochrome matrix liquid crystal
      display modules (Excluding all active matrix liquid crystal
      display modules)
      5.1 General
      5.2 Visual inspection of displays
    6 Visual inspection of monochrome liquid crystal display cells
      (Excluding all active matrix liquid crystal display modules)
      6.1 General
      6.2 Visual inspection of displays
      6.3 Seal inspections
      6.4 Visual inspection of contact pad area
      6.5 Visual inspection for chipped material at the borders and
          edges of the plates of cells
    Annex A (informative) - Cross references index
    Annex ZA (normative) Normative references to international
                            publications with their corresponding
                            European publications

    Abstract - (Show below) - (Hide below)

    Lists test methods applicable to liquid crystal display devices. Takes into account, wherever possible, the environmental test methods outlined in EN 60068. Also includes visual inspection for both liquid crystal display cells and modules. Establishes uniform preferred test methods with preferred values for stress levels for judging the environmental properties of liquid crystal display devices.

    General Product Information - (Show below) - (Hide below)

    Committee CLC/SR 110
    Document Type Standard
    Publisher European Committee for Standards - Electrical
    Status Superseded
    Superseded By

    Standards Referenced By This Book - (Show below) - (Hide below)

    I.S. EN 61747-2-1:2013 LIQUID CRYSTAL DISPLAY DEVICES - PART 2-1: PASSIVE MATRIX MONOCHROME LCD MODULES - BLANK DETAIL SPECIFICATION (IEC 61747-2-1:2013 (EQV))
    CEI EN 62341-5 : 2011 ORGANIC LIGHT EMITTING DIODE (OLED) DISPLAYS - PART 5: ENVIRONMENTAL TESTING METHODS
    I.S. EN 61988-4:2007 PLASMA DISPLAY PANELS - PART 4: CLIMATIC AND MECHANICAL TESTING METHODS
    EN 62341-5:2009 Organic Light Emitting Diode (OLED) displays - Part 5: Environmental testing methods
    EN 61747-5-2 : 2011 LIQUID CRYSTAL DISPLAY DEVICES - PART 5-2: ENVIRONMENTAL, ENDURANCE AND MECHANICAL TEST METHODS - VISUAL INSPECTION OF ACTIVE MATRIX COLOUR LIQUID CRYSTAL DISPLAY MODULES
    EN 61747-5-3 : 2010 LIQUID CRYSTAL DISPLAY DEVICES - PART 5-3: ENVIRONMENTAL, ENDURANCE AND MECHANICAL TEST METHODS - GLASS STRENGTH AND RELIABILITY
    EN 62341-5-2:2013 Organic light emitting diode (OLED) displays - Part 5-2: Mechanical endurance testing methods
    EN 61747-6-3 : 2011 LIQUID CRYSTAL DISPLAY DEVICES - PART 6-3: MEASURING METHODS FOR LIQUID CRYSTAL DISPLAY MODULES - MOTION ARTIFACT MEASUREMENT OF ACTIVE MATRIX LIQUID CRYSTAL DISPLAY MODULES
    BS EN 62341-5:2009 Organic light emitting diode (OLED) displays Environmental testing methods
    BS EN 61747-1:2000 Liquid crystal and solid-state display devices Generic specification
    CEI EN 61747-5-2 : 2012 LIQUID CRYSTAL DISPLAY DEVICES - PART 5-2: ENVIRONMENTAL, ENDURANCE AND MECHANICAL TEST METHODS - VISUAL INSPECTION OF ACTIVE MATRIX COLOUR LIQUID CRYSTAL DISPLAY MODULES
    BS EN 61988-4:2007 Plasma display panels Climatic and mechanical testing methods
    I.S. EN 62341-5:2009 ORGANIC LIGHT EMITTING DIODE (OLED) DISPLAYS - PART 5: ENVIRONMENTAL TESTING METHODS
    CEI EN 61747-1 : 2004 LIQUID CRYSTAL AND SOLID-STATE DISPLAY DEVICES - PART 1: GENERIC SPECIFICATION
    BS EN 61747-6-3:2011 Liquid crystal display devices Measuring methods for liquid crystal display modules. Motion artifact measurement of active matrix liquid crystal display modules
    I.S. EN 61747-5-2:2011 LIQUID CRYSTAL DISPLAY DEVICES - PART 5-2: ENVIRONMENTAL, ENDURANCE AND MECHANICAL TEST METHODS - VISUAL INSPECTION OF ACTIVE MATRIX COLOUR LIQUID CRYSTAL DISPLAY MODULES
    CEI EN 61747-5-3 : 2011 LIQUID CRYSTAL DISPLAY DEVICES - PART 5-3: ENVIRONMENTAL, ENDURANCE AND MECHANICAL TEST METHODS - GLASS STRENGTH AND RELIABILITY
    I.S. EN 62341-5-2:2013 ORGANIC LIGHT EMITTING DIODE (OLED) DISPLAYS - PART 5-2: MECHANICAL ENDURANCE TESTING METHODS (IEC 62341-5-2:2013 (EQV))
    CEI EN 62341-5-2 : 2014 ORGANIC LIGHT EMITTING DIODE (OLED) DISPLAYS - PART 5-2: MECHANICAL ENDURANCE TEST METHODS
    BS EN 61747-2-1:2013 Liquid crystal display devices Passive matrix monochrome LCD modules. Blank detail specification
    BS EN 61747-5-2:2011 Liquid crystal display devices Environmental, endurance and mechanical test methods. Visual inspection of active matrix colour liquid crystal display modules
    CEI EN 61747-3 : 2007 LIQUID CRYSTAL DISPLAY DEVICES - PART 3: LIQUID CRYSTAL DISPLAY (LCD) CELLS - SECTIONAL SPECIFICATION
    EN 61747-3 : 2006 LIQUID CRYSTAL DISPLAY DEVICES - PART 3: LIQUID CRYSTAL DIPLAY (LCD) CELLS - SECTIONAL SPECIFICATION
    EN 61747-2-1:2013 Liquid crystal display devices - Part 2-1: Passive matrix monochrome LCD modules - Blank detail specification
    CEI EN 61988-4 : 2008 PLASMA DISPLAY PANELS - PART 4: CLIMATIC AND MECHANICAL TESTING METHODS
    BS EN 61747-5-3:2010 Liquid crystal display devices Environmental, endurance and mechanical test methods. Glass strength and reliability
    BS EN 62341-5-2:2013 Organic light emitting diode (OLED) displays Mechanical endurance testing methods
    BS EN 61747-6-2:2011 Liquid crystal display devices Measuring methods for liquid crystal display modules. Reflective type
    I.S. EN 61747-5-3:2010 LIQUID CRYSTAL DISPLAY DEVICES - PART 5-3: ENVIRONMENTAL, ENDURANCE AND MECHANICAL TEST METHODS - GLASS STRENGTH AND RELIABILITY
    CEI EN 61747-2-1 : 2014 LIQUID CRYSTAL DISPLAY DEVICES - PART 2-1: PASSIVE MATRIX MONOCHROME LCD MODULES - BLANK DETAIL SPECIFICATION
    BS EN 61747-3:2006 Liquid crystal display devices Liquid crystal display (LCD) cells. Sectional specification
    I.S. EN 61747-3:2006 LIQUID CRYSTAL DISPLAY DEVICES - PART 3: LIQUID CRYSTAL DIPLAY (LCD) CELLS - SECTIONAL SPECIFICATION
    EN 61747-6-2:2011 Liquid crystal display devices - Part 6-2: Measuring methods for liquid crystal display modules - Reflective type
    EN 61988-4 : 2007 PLASMA DISPLAY PANELS - PART 4: CLIMATIC AND MECHANICAL TESTING METHODS

    Standards Referencing This Book - (Show below) - (Hide below)

    HD 323.2.5 : 200S1 BASIC ENVIRONMENTAL TESTING PROCEDURES - TESTS - TEST SA - SIMULATED SOLAR RADIATION AT GROUND LEVEL
    IEC 60068-2-5:2010 Environmental testing - Part 2-5: Tests - Test Sa: Simulated solar radiation at ground level and guidance for solar radiation testing
    HD 323.2.20 : 200S3 BASIC ENVIRONMENTAL TESTING PROCEDURES - TESTS - TEST T - SOLDERING
    IEC 60068-1:2013 Environmental testing - Part 1: General and guidance
    IEC 60068-2-27:2008 Environmental testing - Part 2-27: Tests - Test Ea and guidance: Shock
    HD 323.2.13 : 200S1 BASIC ENVIRONMENTAL TESTING PROCEDURES - TESTS - TEST M: LOW AIR PRESSURE
    IEC 60068-2-20:2008 Environmental testing - Part 2-20: Tests - Test T: Test methods for solderability and resistance to soldering heat of devices with leads
    EN 60068-2-1:2007 Environmental testing - Part 2-1: Tests - Test A: Cold
    EN 60068-2-2:2007 Environmental testing - Part 2-2: Tests - Test B: Dry heat
    IEC 60068-2-21:2006 Environmental testing - Part 2-21: Tests - Test U: Robustness of terminations and integral mounting devices
    IEC 60068-2-13:1983 Basic environmental testing procedures - Part 2-13: Tests - Test M: Low air pressure
    EN 60068-1:2014 Environmental testing - Part 1: General and guidance
    EN 60068-2-7:1993 Environmental testing - Part 2: Tests - Test Ga: Acceleration, steady state
    IEC 60747-5:1992 Semiconductor devices - Discrete devices and integrated circuits -Part 5: Optoelectronic devices
    IEC 60068-2-38:2009 Environmental testing - Part 2-38: Tests - Test Z/AD: Composite temperature/humidity cyclic test
    HD 323.2.30 : 200S3 BASIC ENVIRONMENTAL TESTING PROCEDURES - PART 2: TESTS - TEST DB AND GUIDANCE: DAMP HEAT, CYCLIC (12 + 12-HOUR CYCLE)
    EN 60068-2-27:2009 Environmental testing - Part 2-27: Tests - Test Ea and guidance: Shock
    HD 323.2.3 : 200S2 BASIC ENVIRONMENTAL TESTING PROCEDURES - TESTS - TEST CA - DAMP HEAT, STEADY STATE
    IEC 60068-2-3:1969 Basic environmental testing procedures - Part 2-3: Tests - Test Ca: Damp heat, steady state
    EN 60068-2-21:2006 Environmental testing - Part 2-21: Tests - Test U: Robustness of terminations and integral mounting devices
    IEC 60068-2-2:2007 Environmental testing - Part 2-2: Tests - Test B: Dry heat
    IEC 60747-1:2006+AMD1:2010 CSV Semiconductor devices - Part 1: General
    IEC 60749:1996+AMD1:2000+AMD2:2001 CSV Semiconductor devices - Mechanical and climatic test methods
    EN 60068-2-6:2008 Environmental testing - Part 2-6: Tests - Test Fc: Vibration (sinusoidal)
    IEC 60748-1:2002 Semiconductor devices - Integrated circuits - Part 1: General
    IEC 60068-2-1:2007 Environmental testing - Part 2-1: Tests - Test A: Cold
    IEC 60068-2-14:2009 Environmental testing - Part 2-14: Tests - Test N: Change of temperature
    EN 60068-2-45:1992/A1:1993 Environmental testing - Part 2: Tests - Test Xa and guidance: Immersion in cleaning solvents
    HD 323.2.38 : 200S1 BASIC ENVIRONMENTAL TESTING PROCEDURES - TESTS - TESTS Z/AD: COMPOSITE TEMPERATURE/HUMIDITY CYCLIC TEST
    IEC 60068-2-30:2005 Environmental testing - Part 2-30: Tests - Test Db: Damp heat, cyclic (12 h + 12 h cycle)
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