BS EN 61988-5:2009
Current
The latest, up-to-date edition.
Plasma display panels Generic specification
Hardcopy , PDF
English
28-02-2010
1 Scope
2 Normative references
3 Order of precedence
4 Terminology, units, symbols and abbreviations
5 Standard environmental conditions
6 Marking
7 Quality assessment procedures
8 Qualification approval procedure
9 Capability approval procedures
10 Test and measurement procedures
Annex A (normative) - Lot tolerance percentage
defective (LTPD) sampling plans
Annex B (informative) - General description of
specifications
Annex ZA (normative) - Normative references to
international publications with their
corresponding European publications
Defines general procedures for quality assessment to be used in the IECQ-CECC system and establishes general principles for describing and testing of electrical, optical, mechanical and environmental characteristics.
Committee |
EPL/100
|
DevelopmentNote |
Supersedes 06/30151323 DC. (02/2010)
|
DocumentType |
Standard
|
Pages |
28
|
PublisherName |
British Standards Institution
|
Status |
Current
|
Supersedes |
This generic specification for plasma display panels specifies general procedures for quality assessment to be used in the IECQ-CECC system and establishes general principles for describing and testing of electrical, optical, mechanical and environmental characteristics.
Standards | Relationship |
EN 61988-5 : 2009 | Identical |
IEC 61988-5:2009 | Identical |
IEC 61988-1:2011 | Plasma display panels - Part 1: Terminology and letter symbols |
EN 61988-1:2011 | Plasma display panels - Part 1: Terminology and letter symbols |
EN 61988-4 : 2007 | PLASMA DISPLAY PANELS - PART 4: CLIMATIC AND MECHANICAL TESTING METHODS |
IEC 61988-2-1:2012 | Plasma display panels - Part 2-1: Measuring methods - Optical and optoelectrical |
IEC 61988-3-1:2005 | Plasma display panels - Part 3-1: Mechanical interface |
IECQ 01:2014 | IEC QUALITY ASSESSMENT SYSTEM FOR ELECTRONIC COMPONENTS (IECQ SYSTEM) - BASIC RULES |
IEC 60410:1973 | Sampling plans and procedures for inspection by attributes |
ISO 3534-2:2006 | Statistics — Vocabulary and symbols — Part 2: Applied statistics |
IEC 61988-4:2007 | Plasma display panels - Part 4: Climatic and mechanical testing methods |
ISO 2859-10:2006 | Sampling procedures for inspection by attributes Part 10: Introduction to the ISO 2859 series of standards for sampling for inspection by attributes |
IEC 60747-1:2006+AMD1:2010 CSV | Semiconductor devices - Part 1: General |
EN 61988-2-2:2003 | Plasma display panels - Part 2-2: Measuring methods - Optoelectrical |
EN 61988-3-1:2005 | Plasma display panels - Part 3-1: Mechanical interface |
EN 61988-2-1:2012 | Plasma display panels - Part 2-1: Measuring methods - Optical and optoelectrical |
IEC 61988-2-2:2003 | Plasma display panels - Part 2-2: Measuring methods - Optoelectrical |
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