• BS EN 62047-3:2006

    Current The latest, up-to-date edition.

    Semiconductor devices. Micro-electromechanical devices Thin film standard test piece for tensile testing

    Available format(s):  Hardcopy, PDF

    Language(s):  English

    Published date:  30-11-2006

    Publisher:  British Standards Institution

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    Table of Contents - (Show below) - (Hide below)

    Scope
    2 Normative references
    3 Test piece materials
    4 Test piece fabrications
    5 Plane shape of test piece
    6 Test piece thickness
    7 Gauge mark
    8 Test
    9 Document attached to standard test pieces
    Annex A (informative) Test piece
    Annex ZA (normative) Normative references to international
             publications with their corresponding European
             publications

    Abstract - (Show below) - (Hide below)

    Specifies a standard test piece, which is used to guarantee the propriety and accuracy of a tensile testing system for thin film materials with length and width under 1 mm and thickness under 10[mu]m, which are main structural materials for microelectromechanical systems (MEMS), micromachines and similar devices.

    Scope - (Show below) - (Hide below)

    Specifies a standard test piece, which is used to guarantee the propriety and accuracy of a tensile testing system for thin film materials with length and width under 1 mm and thickness under 10 m, which are main structural materials for microelectromechanical systems (MEMS), micromachines and similar devices. It is based on such a concept that a tensile testing system can be guaranteed in propriety and accuracy, when the measured tensile strengths of the standard test pieces, whose tensile strength is pre-determined, are within the designated range. It also specifies the test pieces to minimize characteristics deviation among the pieces.

    General Product Information - (Show below) - (Hide below)

    Committee EPL/47
    Development Note Supersedes 05/30104054 DC (12/2006)
    Document Type Standard
    Publisher British Standards Institution
    Status Current
    Supersedes

    Standards Referencing This Book - (Show below) - (Hide below)

    IEC 62047-2:2006 Semiconductor devices - Micro-electromechanical devices - Part 2: Tensile testing method of thin film materials
    EN 62047-2:2006 Semiconductor devices - Micro-electromechanical devices - Part 2: Tensile testing method of thin film materials
    ISO 17561:2016 Fine ceramics (advanced ceramics, advanced technical ceramics) — Test method for elastic moduli of monolithic ceramics at room temperature by sonic resonance
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