BS EN 62132-8:2012
Current
The latest, up-to-date edition.
Integrated circuits. Measurement of electromagnetic immunity Measurement of radiated immunity. IC stripline method
Hardcopy , PDF
English
31-10-2012
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1 Scope
2 Normative references
3 Terms and definitions
4 General
5 Test conditions
6 Test equipment
7 Test setup
8 Test procedure
9 Test report
10 RF immunity acceptance level
Annex A (normative) - Field strength determination
Annex B (normative) - IC stripline descriptions
Annex C (informative) - Closed stripline
geometrical limitations
Bibliography
Annex ZA (normative) - Normative references to
international publications with their
corresponding European publications
Defines a method for measuring the immunity of an integrated circuit (IC) to radio frequency (RF) radiated electromagnetic disturbances over the frequency range of 150 kHz to 3 GHz.
| Committee |
EPL/47
|
| DevelopmentNote |
Supersedes 09/30191126 DC. (10/2012)
|
| DocumentType |
Standard
|
| Pages |
26
|
| PublisherName |
British Standards Institution
|
| Status |
Current
|
| Supersedes |
IEC 62132-8:2012 specifies a method for measuring the immunity of an integrated circuit (IC) to radio frequency (RF) radiated electromagnetic disturbances over the frequency range of 150 kHz to 3 GHz.
This publication is to be read in conjunction with IEC 62132-1:2006.
| Standards | Relationship |
| EN 61804-2:2007 | Identical |
| EN 62132-8 : 2012 | Identical |
| IEC 62132-8:2012 | Identical |
| EN 62132-1:2016 | Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions |
| IEC 62132-1:2015 | Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions |
| IEC 61000-4-20:2010 | Electromagnetic compatibility (EMC) - Part 4-20: Testing and measurement techniques - Emission and immunity testing in transverse electromagnetic (TEM) waveguides |
| EN 61000-4-20:2010 | ELECTROMAGNETIC COMPATIBILITY (EMC) - PART 4-20: TESTING AND MEASUREMENT TECHNIQUES - EMISSION AND IMMUNITY TESTING IN TRANSVERSE ELECTROMAGNETIC (TEM) WAVEGUIDES |
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