BS EN 62329-1:2006

Foreword
INTRODUCTION
1 Scope
2 Normative references
3 Terms and definitions
4 Specimens
5 Classification
6 Ordering
7 Dimensions
8 Colour
9 Finish
10 Packaging
11 Labelling
12 Qualification approval requirements
13 Consignment tests
Annex A (informative) Heat shrinkable moulded shapes
                      (typical configuration after
                      recovery)
Annex ZA (normative) Normative references to international
                     publications with their corresponding
                     European publications
Bibliography

Applies to heat shrinkable moulded shapes in a range of configurations and materials suitable for insulation, environmental sealing, mechanical protection and strain relief for connector/cable terminations and multi-way transitions.

IEC TS 62396-2:2008 (E) provides guidance related to the testing of microelectronic devices for purposes of measuring their susceptibility to single event effects (SEE) induced by the atmospheric neutrons. Since the testing can be performed in a number of different ways, using different kinds of radiation sources, it also shows how the test data can be used to estimate the SEE rate of devices and boards due to the atmospheric neutrons in the atmosphere at aircraft altitudes.