IEC TS 62396-2:2008

FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terms and definitions
4 Abbreviations used in the document
5 Obtaining SEE data
  5.1 Types of SEE data
  5.2 Use of existing SEE data
  5.3 Deciding to perform dedicated SEE tests
6 Availability of existing SEE data for avionics applications
  6.1 Variability of SEE data
  6.2 Types of existing SEE data that may be used
      6.2.1 Sources of data, proprietary versus published data
      6.2.2 Data based on the use of different sources
      6.2.3 Ground level versus avionics applications
  6.3 Sources of existing data
7 Considerations for SEE testing
  7.1 General
  7.2 Selection of hardware to be tested
  7.3 Selection of test method
  7.4 Selection of facility providing energetic particles
      7.4.1 Radiation sources
      7.4.2 Spallation neutron source
      7.4.3 Monoenergetic and quasi-monoenergetic beam sources
      7.4.4 Thermal neutron sources
8 Converting test results to avionics SEE rates
  8.1 General
  8.2 Use of spallation neutron source
  8.3 Use of SEU cross section curve over energy
Bibliography

IEC TS 62396-2:2008 (E) provides guidance related to the testing of microelectronic devices for purposes of measuring their susceptibility to single event effects (SEE) induced by the atmospheric neutrons. Since the testing can be performed in a number of different ways, using different kinds of radiation sources, it also shows how the test data can be used to estimate the SEE rate of devices and boards due to the atmospheric neutrons in the atmosphere at aircraft altitudes.