BS EN 62595-1-1:2013
Current
The latest, up-to-date edition.
LCD backlight unit Generic specification
Hardcopy , PDF
English
31-07-2013
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1 Scope
2 Normative references
3 Technical aspects
4 Quality assessment procedures
5 Test and measurement procedures
Annex A (informative) - Examples of BLU drawings
Annex B (informative) - Lot tolerance percentage
defective (LTPD) sampling plans
Annex ZA (normative) - Normative references to
international publications with their
corresponding European publications
Specifies general procedures for quality assessment and gives general rules for the measuring methods of electrical and optical characteristics, for climatic and mechanical tests, and rules for endurance tests.
| Committee |
EPL/100
|
| DevelopmentNote |
Supersedes 11/30234042 DC. (08/2013)
|
| DocumentType |
Standard
|
| Pages |
26
|
| PublisherName |
British Standards Institution
|
| Status |
Current
|
| Supersedes |
This part of IEC 62595 is a generic specification for backlight unit (BLU) for liquid crystal displays. It defines general procedures for quality assessment and gives general rules for the measuring methods of electrical and optical characteristics, rules for climatic and mechanical tests, and rules for endurance tests.
| Standards | Relationship |
| IEC 62595-1-1:2013 | Identical |
| EN 62595-1-1:2013 | Identical |
| EN ISO 80000-1:2013 | Quantities and units - Part 1: General (ISO 80000-1:2009 + Cor 1:2011) |
| IEC 61747-10-2:2014 | Liquid crystal display devices - Part 10-2: Environmental, endurance and mechanical test methods - Environmental and endurance |
| EN 62595-2:2013 | LCD backlight unit - Part 2: Electro-optical measurement methods of LED backlight unit |
| IECQ 001002-3:2005 | IEC QUALITY ASSESSMENT SYSTEM FOR ELECTRONIC COMPONENTS (IECQ) - RULES OF PROCEDURE - PART 3: APPROVAL PROCEDURES |
| IECQ 001002-2:1998 | IEC QUALITY ASSESSMENT SYSTEM FOR ELECTRONIC COMPONENTS (IECQ) - RULES OF PROCEDURE - PART 2: DOCUMENTATION |
| IEC 60747-10:1991 | Semiconductor devices - Part 10: Generic specification for discrete devices and integrated circuits |
| IEC 62595-2:2012 | LCD backlight unit - Part 2: Electro-optical measurement methods of LED backlight unit |
| IEC 60410:1973 | Sampling plans and procedures for inspection by attributes |
| IEC 60747-1:2006+AMD1:2010 CSV | Semiconductor devices - Part 1: General |
| ISO 80000-1:2009 | Quantities and units — Part 1: General |
| EN 62595-1-2:2012 | LCD backlight unit - Part 1-2: Terminology and letter symbols |
| IEC 62595-1-2:2016 | Display lighting unit - Part 1-2: Terminology and letter symbols |
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