BS EN 62884-2:2017

FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terms and definitions
4 Test and measurement procedures
5 Measurement and the measurement environment
6 Measurement
7 Other points to be noted
8 Miscellaneous
Annex A (normative) - Calculation method for the
        amount of phase jitter
Bibliography
Annex ZA (normative) - Normative references to
         international publications with their
         corresponding European publications

Describes the methods for the measurement and evaluation of the phase jitter measurement of piezoelectric, dielectric and electrostatic oscillators, including dielectric resonator oscillators (DROs) and oscillators using a thin-film bulk acoustic resonator (FBAR) (hereinafter referred to as an 'Oscillator') and gives guidance for phase jitter that allows the accurate measurement of RMS jitter.

This part of IEC 62884 specifies the methods for the measurement and evaluation of the phase jitter measurement of piezoelectric, dielectric and electrostatic oscillators, including dielectric resonator oscillators (DROs) and oscillators using a thin-film bulk acoustic resonator (FBAR) (hereinafter referred to as an \'Oscillator\') and gives guidance for phase jitter that allows the accurate measurement of RMS jitter.

In the measurement method, phase noise measurement equipment or a phase noise measurement system is used.

NOTE Dielectric resonator oscillators (DROs) and oscillators using FBAR are under consideration.