• There are no items in your cart

EN 60469:2013

Current

Current

The latest, up-to-date edition.

Transitions, pulses and related waveforms - Terms, definitions and algorithms

Published date

28-06-2013

FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terms, definitions and symbols
4 Measurement and analysis techniques
5 Analysis algorithms for waveforms
Annex A (informative) - Waveform examples
Bibliography

IEC 60469:2013 provides definitions of terms pertaining to transitions, pulses, and related waveforms and provides definitions and descriptions of techniques and procedures for measuring their parameters. The waveforms considered in this standard are those that make a number of transitions and that remain relatively constant in the time intervals between transitions. Signals and their waveforms for which this standard apply include but are not limited to those used in: - digital communications, data communications, and computing; - studies of transient biological, cosmological, and physical events; - and electrical, chemical, and thermal pulses encountered and used in a variety of industrial, commercial, and consumer applications. This standard does not apply to sinusoidally-varying or other continuously-varying signals and their waveforms. The object of this standard is to facilitate accurate and precise communication concerning parameters of transitions, pulses, and related waveforms and the techniques and procedures for measuring them. IEC 60469:2013 combine the contents of IEC 60469-1 and IEC 60469-2. IEC 60469-1 dealt with terms and definitions for describing waveform parameters and IEC 60469-2 described the waveform measurement process. Other technical revisions include updating of terminology, errors correction, algorithms addition for computing values of pulse parameters, and addition of a newly-developed method for computing state levels. Changes to the definitions include adding new terms and definitions, deleting unused terms and definitions, expanding the list of deprecated terms, and updating and modifying existing definitions.

Committee
CLC/TC 85X
DocumentType
Standard
PublisherName
European Committee for Standards - Electrical
Status
Current

Standards Relationship
PN EN 60469 : 2014 Identical
NF EN 60469 : 2013 Identical
UNE-EN 60469:2013 Identical
CEI EN 60469 : 2014 Identical
SN EN 60469:2013 Identical
DIN EN 60469:2014-02 Identical
IEC 60469:2013 Identical
I.S. EN 60469:2013 Identical
NEN EN IEC 60469 : 2013 Identical
BS EN 60469:2013 Identical
NBN EN 60469 : 2013 Identical
PNE-FprEN 60469 Identical

BS EN 62884-1:2017 Measurement techniques of piezoelectric, dielectric and electrostatic oscillators Basic methods for the measurement
EN 62884-2:2017 Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 2: Phase jitter measurement method
EN 62884-1:2017 Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 1: Basic methods for the measurement
I.S. EN 62884-2:2017 MEASUREMENT TECHNIQUES OF PIEZOELECTRIC, DIELECTRIC AND ELECTROSTATIC OSCILLATORS - PART 2: PHASE JITTER MEASUREMENT METHOD
CEI EN 60679-1 : 2009 PIEZOELECTRIC, DIELECTRIC AND ELECTROSTATIC OSCILLATORS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION
EN 62754:2017 Computation of waveform Parameter uncertainties
CEI EN 62884-1 : 1ED 2018 MEASUREMENT TECHNIQUES OF PIEZOELECTRIC, DIELECTRIC AND ELECTROSTATIC OSCILLATORS - PART 1: BASIC METHODS FOR THE MEASUREMENT
BS EN 62884-2:2017 Measurement techniques of piezoelectric, dielectric and electrostatic oscillators Phase jitter measurement method
I.S. EN 60679-1:2017 PIEZOELECTRIC, DIELECTRIC AND ELECTROSTATIC OSCILLATORS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION
I.S. EN 62884-1:2017 MEASUREMENT TECHNIQUES OF PIEZOELECTRIC, DIELECTRIC AND ELECTROSTATIC OSCILLATORS - PART 1: BASIC METHODS FOR THE MEASUREMENT
BS EN 60679-1:2017 Piezoelectric, dielectric and electrostatic oscillators of assessed quality Generic specification
EN 60679-1:2017 Piezoelectric, dielectric and electrostatic oscillators of assessed quality - Part 1: Generic specification
CEI EN 62754 : 1ED 2017 COMPUTATION OF WAVEFORM PARAMETER UNCERTAINTIES
BS EN 62754:2017 Computation of waveform parameter uncertainties
EN IEC 62884-3:2018 Measurement techniques of piezoelectric, dielectric and electrostatic oscillators – Part 3: Frequency aging test methods
I.S. EN 62754:2017 COMPUTATION OF WAVEFORM PARAMETER UNCERTAINTIES

IEEE 270-2006 IEEE Standard Definitions for Selected Quantities, Units, and Related Terms, with Special Attention to the International System of Units (SI)
IEEE/ASTM SI_10-2010 American National Standard for Metric Practice
ISO/IEC Guide 99:2007 International vocabulary of metrology Basic and general concepts and associated terms (VIM)
ISO 10012:2003 Measurement management systems — Requirements for measurement processes and measuring equipment
ISO 9000:2015 Quality management systems — Fundamentals and vocabulary
ISO/IEC Guide 98-3:2008 Uncertainty of measurement — Part 3: Guide to the expression of uncertainty in measurement (GUM:1995)

Sorry this product is not available in your region.

Access your standards online with a subscription

Features

  • Simple online access to standards, technical information and regulations.

  • Critical updates of standards and customisable alerts and notifications.

  • Multi-user online standards collection: secure, flexible and cost effective.