• There are no items in your cart

BS EN IEC 60749-13:2018

Current

Current

The latest, up-to-date edition.

Semiconductor devices. Mechanical and climatic test methods Salt atmosphere

Published date

30-04-2018

This PART of IEC 60749 describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast atmosphere on all exposed surfaces. It is only applicable to those devices specified for a marine environment.

The salt atmosphere test is considered destructive.

Committee
EPL/47
DevelopmentNote
Supersedes BS EN 60749-13. (06/2018)
DocumentType
Standard
PublisherName
British Standards Institution
Status
Current
Supersedes

Standards Relationship
EN IEC 60749-13:2018 Identical
IEC 60749-13:2018 Identical
IEC 60749-13:2002 Identical

View more information
Sorry this product is not available in your region.

Access your standards online with a subscription

Features

  • Simple online access to standards, technical information and regulations.

  • Critical updates of standards and customisable alerts and notifications.

  • Multi-user online standards collection: secure, flexible and cost effective.