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BS EN 60749-13:2002

Superseded

Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

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superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

Semiconductor devices. Mechanical and climatic test methods Salt atmosphere

Available format(s)

Hardcopy , PDF

Superseded date

30-04-2018

Language(s)

English

Published date

17-09-2002

Foreword
1 Scope
2 Normative references
3 Test apparatus
4 Procedure
5 Summary
Annex ZA (normative) Normative references to international
         publications with their corresponding European
         publications

Gives a salt atmosphere test that determine the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast atmosphere on all exposed surfaces. It is only applicable to those devices which specified for a marine environment.

Describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast atmosphere on all exposed surfaces. It is only applicable to those devices specified for a marine environment. The salt atmosphere test is considered destructive. The contents of the corrigendum of August 2003 have been included in this copy.

Committee
EPL/47
DevelopmentNote
Supersedes 00/203574 DC (09/2002) Supersedes BS EN 60749. (09/2005)
DocumentType
Standard
Pages
10
PublisherName
British Standards Institution
Status
Superseded
SupersededBy
Supersedes

Standards Relationship
I.S. EN 60749-13:2002 Identical
NBN EN 60749-13 : 2003 Identical
UNE-EN 60749-13:2003 Identical
IEC 60749-13:2002 Identical
NF EN 60749-13 : 2002 Identical
DIN EN 60749-13:2003-04 Identical
EN 60749-13:2002 Identical

IEC 60068-2-11:1981 Basic environmental testing procedures - Part 2-11: Tests - Test Ka: Salt mist
EN 60068-2-11:1999 Environmental testing - Part 2: Tests - Test Ka: Salt mist
IEC 60749-14:2003 Semiconductor devices - Mechanical and climatic test methods - Part 14: Robustness of terminations (lead integrity)

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