BS EN ISO 5436-1:2001
Current
The latest, up-to-date edition.
Geometrical Product Specifications (GPS). Surface texture: Profile method; Measurement standards Geometric product specifications (GPS). Surface texture. Profile method calibration. Measurement standards
Hardcopy , PDF
English
23-08-2001
Important note : Users cannot be edited or removed once added to your Multi user PDF.
1 Scope
2 Normative references
3 Terms and definitions
4 Design requirements
4.1 Material
4.2 Size of measurement standard
5 Types, purposes and metrological characteristics of
measurement standards
5.1 General
5.2 Type A - Depth measurement standard
5.3 Type B - Tip condition measurement standard
5.4 Type C - Spacing measurement standard
5.5 Type D - Roughness measurement standard
5.6 Type E - Profile co-ordinate measurement standard
6 Measurement standard requirements
6.1 Type A - Depth measurement standard
6.2 Type B - Tip condition measurement standard
6.3 Type C - Spacing measurement standard
6.4 Type D - Roughness measurement standard
6.5 Type E - Profile co-ordinate measurement standard
7 Definition of the measurements for the measurement
standards
7.1 Type A1
7.2 Type A2 0025
7.3 Type B2
7.4 Type B3
7.5 Types C1 to C4, and D
7.6 Type E1
7.7 Type E2
8 Measurement standard certificate
Annex A (informative) Relation to the GPS matrix model
Bibliography
Defines the characteristics of material measures which are used as measurement standards (etalons) for the calibration of metrological characteristics of instruments for measuring surface texture by the profile method defined in ISO 3274.
| Committee |
TPR/1
|
| DocumentType |
Standard
|
| Pages |
26
|
| PublisherName |
British Standards Institution
|
| Status |
Current
|
| Standards | Relationship |
| UNI EN ISO 5436-1 : 2001 | Identical |
| SN EN ISO 5436-1 : 2000 | Identical |
| NF EN ISO 5436-1 : 2000 | Identical |
| ISO 5436-1:2000 | Identical |
| NS EN ISO 5436-1 : 1ED 2000 | Identical |
| NEN EN ISO 5436-1 : 2000 | Identical |
| UNE-EN ISO 5436-1:2001 | Identical |
| I.S. EN ISO 5436-1:2000 | Identical |
| NBN EN ISO 5436-1 : 2000 | Identical |
| EN ISO 5436-1:2000 | Identical |
| DIN EN ISO 5436-1:2000-11 | Identical |
| 10/30213632 DC : 0 | BS 1134 - ASSESSMENT OF SURFACE TEXTURE - GUIDANCE AND GENERAL INFORMATION |
| BS 1134:2010 | Assessment of surface texture. Guidance and general information |
| ISO 4287:1997 | Geometrical Product Specifications (GPS) — Surface texture: Profile method — Terms, definitions and surface texture parameters |
| ISO/TS 14253-2:1999 | Geometrical Product Specifications (GPS) Inspection by measurement of workpieces and measuring equipment Part 2: Guide to the estimation of uncertainty in GPS measurement, in calibration of measuring equipment and in product verification |
| EN ISO 4288:1997 | Geometrical product specifications (GPS) - Surface texture: Profile method - Rules and procedures for the assessment of surface texture (ISO 4288:1996) |
| EN 30012-1 : 1993 | QUALITY ASSURANCE REQUIREMENTS FOR MEASURING EQUIPMENT - METROLOGICAL CONFIRMATION SYSTEM FOR MEASURING EQUIPMENT |
| ISO 3274:1996 | Geometrical Product Specifications (GPS) — Surface texture: Profile method — Nominal characteristics of contact (stylus) instruments |
| ISO 10012-1:1992 | Quality assurance requirements for measuring equipment Part 1: Metrological confirmation system for measuring equipment |
| EN ISO 3274:1997 | Geometrical product specifications (GPS) - Surface texture: Profile method - Nominal characteristics of contact (stylus) instruments (ISO 3274:1996) |
Access your standards online with a subscription
Features
-
Simple online access to standards, technical information and regulations.
-
Critical updates of standards and customisable alerts and notifications.
-
Multi-user online standards collection: secure, flexible and cost effective.