BS IEC 60747-14.2 : 2000
Current
The latest, up-to-date edition.
SEMICONDUCTOR DEVICES - PART 14-2: SEMICONDUCTOR SENSORS - HALL ELEMENTS
Hardcopy , PDF
English
01-01-2000
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FOREWORD
INTRODUCTION
Clause
1 General
1.1 Scope
1.2 Normative references
1.3 Definitions
1.4 Symbols
2 Essential ratings and characteristics
2.1 General
2.2 Ratings (limiting values)
2.3 Characteristics
3 Measuring methods
3.1 General
3.2 Output Hall voltage (VH)
3.3 Offset voltage (Vo)
3.4 Input resistance (Rin)
3.5 Output resistance (Rout)
3.6 Temperature coefficient of output Hall
voltage (alpha VH)
3.7 Temperature coefficient of input resistance
(alpha Rin)
3.5
Gives standards for packaged semiconductor Hall elements which utilize the Hall effect.
| Committee |
EPL/47
|
| DevelopmentNote |
Supersedes 93/200028 DC. (06/2005)
|
| DocumentType |
Standard
|
| Pages |
18
|
| PublisherName |
British Standards Institution
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| IEC 60747-14-2:2000 | Identical |
| IEC 60747-1:2006+AMD1:2010 CSV | Semiconductor devices - Part 1: General |
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