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BS IEC 60747-14-5:2010

Current

Current

The latest, up-to-date edition.

Semiconductor devices Semiconductor sensors. PN-junction semiconductor temperature sensor

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

30-04-2010

€156.59
Excluding VAT

Committee
EPL/47
DevelopmentNote
Supersedes 07/30164953 DC. (04/2010)
DocumentType
Standard
Pages
22
PublisherName
British Standards Institution
Status
Current
Supersedes

IEC 60747-14-5:2010 is applicable to semiconductor PN-junction temperature sensors and defines terms, definitions, symbols, essential ratings, characteristics and test methods that can be used to determine the characteristics of semiconductor types of PN-junction temperature sensors.

Standards Relationship
IEC 60747-14-5:2010 Identical

IEC 60749-5:2017 Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
IEC 60749-1:2002 Semiconductor devices - Mechanical and climatic test methods - Part 1: General
IEC 60749-36:2003 Semiconductor devices - Mechanical and climatic test methods - Part 36: Acceleration, steady state
IEC 60747-14-1:2010 Semiconductor devices - Part 14-1: Semiconductor sensors - Generic specification for sensors
IEC 60721-3-0:1984+AMD1:1987 CSV Classification of environmental conditions - Part 3: Classification of groups of environmental parameters and their severities - Introduction
IEC 60747-1:2006+AMD1:2010 CSV Semiconductor devices - Part 1: General
IEC 60749-6:2017 Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature
IEC 60721-3-1:1997 Classification of environmental conditions - Part 3 Classification of groups of environmental parameters and their severities - Section 1: Storage

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