BS IEC 61586:1997

FOREWORD
INTRODUCTION
1 Scope
2 General considerations
    2.1 Intrinsic degradation mechanisms
    2.2 Extrinsic degradation mechanisms
    2.3 Control of extrinsic degradation
    2.4 Failure modes and failure mechanisms
    2.5 Degradation mechanisms
3 Test methods and acceleration factors
4 Reliability statistics
5 Acceptance criteria
6 Estimation of the reliability of multi-position
    connectors
    6.1 Estimation of connector reliability from contact
          reliability when the contacts in a connector
          perform statistically independently
    6.2 Estimation of connector reliability using
          asymptotic extreme-value distributions
7 Summary and conclusions
Annexes
A Detailed example of an extreme-value reliability
    calculation
B Bibliography

Concerned with the estimating of the reliability of electrical connectors through defining and developing an appropriate accelerated testing programme. Reviews basic intrinsic degradation mechanisms of connectors to give a context for the developing of the desired test programme.